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Processing, Analysis and Visualization of CT Data

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Industrial X-Ray Computed Tomography

Abstract

In an almost inexhaustible multitude of possibilities, CT allows to inspect highly complex systems and materials. Compared to other testing techniques CT provides results in a quick way: It is nondestructive and does not interfere with the specimen, it allows non-touching characterizations and what is most important CT allows to characterize hidden or internal features. However, CT would not have reached its current status in engineering without the achievements and possibilities in data processing. Only through processing, analysis and visualization of CT data, detailed insights into previously unachievable analyses are facilitated. Novel means of data analysis and visualization illustrate highly complex problems by means of clear and easy to understand renderings. In this chapter, we explore various aspects starting from the generalized data analysis pipeline, aspects of processing, analysis and visualization for metrology, nondestructive testing as well as specialized analyses.

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Authors and Affiliations

  1. University of Applied Sciences—Upper Austria, Wels Campus, Wels, Austria

    Christoph Heinzl, Alexander Amirkhanov & Johann Kastner

Authors
  1. Christoph Heinzl
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  2. Alexander Amirkhanov
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  3. Johann Kastner
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Correspondence to Christoph Heinzl .

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Editors and Affiliations

  1. Department of Management and Engineering, University of Padova, Vicenza, Italy

    Simone Carmignato

  2. Department of Mechanical Engineering, KU Leuven, Leuven, Belgium

    Wim Dewulf

  3. University of Nottingham, Nottingham, United Kingdom

    Richard Leach

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Heinzl, C., Amirkhanov, A., Kastner, J. (2018). Processing, Analysis and Visualization of CT Data. In: Carmignato, S., Dewulf, W., Leach, R. (eds) Industrial X-Ray Computed Tomography. Springer, Cham. https://doi.org/10.1007/978-3-319-59573-3_4

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