Abstract
A design of double resonant control combined with a model-free decoupling filter (MFDF) is presented in this paper. The design is demonstrated using the proposed MFDF to decouple a parallel multi-input multi-output (MIMO) system into several single-input single-output systems and applying a double resonant controller for vibration damping and cross coupling reduction in nanopositioners. Raster scan results of simulations based on an identified MIMO transfer function of a nanopositioning stage over an area of 4 μm × 0.4 μm with small RMS errors are demonstrated. Comparisons with using the double resonant controller alone show the effectiveness of the proposed controller.
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Devasia, S., Eleftheriou, E., Moheimani, S.O.R.: A survey of control issues in nanopositioning. IEEE Trans. Control Syst. Technol. 15(5), 802–823 (2007)
Ando, T.: High-speed atomic force microscopy coming of age. Nanotechnology 23(6), 062001 (2012)
Pantazi, A., Sebastian, A., Antonakopoulos, T.A., et al.: Probe-based ultrahigh-density storage technology. IBM J. Res. Dev. 52(4.5), 493–511 (2008)
Paul, P.C., Knoll, A.W., Holzner, F., et al.: Rapid turnaround scanning probe nanolithography. Nanotechnology 22(27), 275306 (2011)
Yong, Y.K., Moheimani, S.O.R., Kenton, B.J., et al.: Invited review article: high-speed flexure-guided nanopositioning: Mechanical design and control issues. Rev. Sci. Instrum. 83(12), 121101 (2012)
Yong, Y.K., Aphale, S.S., Moheimani, S.O.R.: Design, identification, and control of a flexure-based XY stage for fast nanoscale positioning. IEEE Trans. Nanotechnol. 8(1), 46–54 (2009)
Tuma, T., Sebastian, A., Lygeros, J., et al.: The four pillars of nanopositioning for scanning probe microscopy: the position sensor, the scanning device, the feedback controller, and the reference trajectory. Control Syst. 33(6), 68–85 (2013)
Gu, G.Y., Zhu, L.M., Su, C.Y., et al.: Modeling and control of piezo-actuated nanopositioning stages: a survey. IEEE Trans. Autom. Sci. Eng. 13(1), 313–332 (2016)
Janocha, H., Kuhnen, K.: Real-time compensation of hysteresis and creep in piezoelectric actuators. Sens. Actuators A Phys. 79(2), 83–89 (2000)
Clayton, G.M., Tien, S., Leang, K.K., et al.: A review of feedforward control approaches in nanopositioning for high-speed SPM. J. Dyn. Syst. Measur. Control 131(6), 061101 (2009)
Yong, Y.K., Liu, K., Moheimani, S.O.R.: Reducing cross-coupling in a compliant XY nanopositioner for fast and accurate raster scanning. IEEE Trans. Control Syst. Technol. 18(5), 1172–1179 (2010)
Li, Y., Xu, Q.: Development and assessment of a novel decoupled XY parallel micropositioning platform. IEEE/ASME Trans. Mechatron. 15(1), 125–135 (2010)
Croft, D., Devasia, S.: Vibration compensation for high speed scanning tunneling microscopy. Rev. Sci. Instrum. 70(12), 4600–4605 (1999)
Schitter, G., Stemmer, A.: Identification and open-loop tracking control of a piezoelectric tube scanner for high-speed scanning-probe microscopy. IEEE Trans. Control Syst. Technol. 12(3), 449–454 (2004)
Das, S.K., Pota, H.R., Petersen, I.R.: Damping controller design for nanopositioners: a mixed passivity, negative-imaginary, and small-gain approach. IEEE/ASME Trans. Mechatron. 20(1), 416–426 (2015)
Croft, D., Shed, G., Devasia, S.: Creep, hysteresis, and vibration compensation for piezoactuators: atomic force microscopy application. J. Dyn. Syst. Measur. Control 123(1), 35–43 (2001)
Leang, K.K., Devasia, S.: Feedback-linearized inverse feedforward for creep, hysteresis, and vibration compensation in AFM piezoactuators. IEEE Trans. Control Syst. Technol. 15(5), 927–935 (2007)
Das, S.K., Pota, H.R., Petersen, I.R.: A MIMO double resonant controller design for nanopositioners. IEEE Trans. Nanotechnol. 14(2), 224–237 (2015)
Ter Braake, J.: Iterative Learning Control for High-Speed Atomic Force Microscopy. TU Delft, Delft University of Technology (2009)
Barton, K.L., Hoelzle, D.J., Alleyne, A.G., et al.: Cross-coupled iterative learning control of systems with dissimilar dynamics: design and implementation. Int. J. Control 84(7), 1223–1233 (2011)
Ling, J., Feng, Z., Xiao, X.: A position domain cross-coupled iteration learning control for contour tracking in multi-axis precision motion control systems. In: Liu, H., Kubota, N., Zhu, X., Dillmann, R. (eds.) ICIRA 2015. LNCS, vol. 9244, pp. 667–679. Springer, Heidelberg (2015)
Mahmood, I.A., Moheimani, S.O.R.: Making a commercial atomic force microscope more accurate and faster using positive position feedback control. Rev. Sci. Instrum. 80(6), 063705 (2009)
Aphale, S.S., Bhikkaji, B., Moheimani, S.O.R.: Minimizing scanning errors in piezoelectric stack-actuated nanopositioning platforms. IEEE Trans. Nanotechnol. 7(1), 79–90 (2008)
Bhikkaji, B., Ratnam, M., Fleming, A.J., et al.: High-performance control of piezoelectric tube scanners. IEEE Trans. Control Syst. Technol. 15(5), 853–866 (2007)
Pota, H.R., Moheimani, S.O.R., Smith, M.: Resonant controllers for smart structures. Smart Mater. Struct. 11(1), 1–8 (2002)
Bhikkaji, B., Moheimani, S.O.R.: Integral resonant control of a piezoelectric tube actuator for fast nanoscale positioning. IEEE/ASME Trans. Mechatron. 13(5), 530–537 (2008)
Das, S.K., Pota, H.R., Petersen, I.R.: Multivariable negative-imaginary controller design for damping and cross coupling reduction of nanopositioners: a reference model matching approach. IEEE/ASME Trans. Mechatron. 20(6), 3123–3134 (2015)
Das, S.K., Pota, H.R., Petersen, I.R.: Resonant controller design for a piezoelectric tube scanner: a mixed negative-imaginary and small-gain approach. IEEE Trans. Control Syst. Technol. 22(5), 1899–1906 (2014)
Li, Y., Xu, Q.: Modeling and performance evaluation of a flexure-based XY parallel micromanipulator. Mech. Mach. Theor. 44(12), 2127–2152 (2009)
Aphale, S.S., Devasia, S., Moheimani, S.O.R.: High-bandwidth control of a piezoelectric nanopositioning stage in the presence of plant uncertainties. Nanotechnology 19(12), 125503 (2008)
Ljung, L.: System identification: theory for the user. PTR Prentice Hall Information and System Sciences Series (1999)
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This research was sponsored by National Natural Science Foundation of China (NSFC, Grant No. 51375349).
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Ling, J., Feng, Z., Ming, M., Xiao, X. (2016). Combined Model-Free Decoupling Control and Double Resonant Control in Parallel Nanopositioning Stages for Fast and Precise Raster Scanning. In: Kubota, N., Kiguchi, K., Liu, H., Obo, T. (eds) Intelligent Robotics and Applications. ICIRA 2016. Lecture Notes in Computer Science(), vol 9834. Springer, Cham. https://doi.org/10.1007/978-3-319-43506-0_5
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DOI: https://doi.org/10.1007/978-3-319-43506-0_5
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