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International Conference on Image Analysis and Recognition

ICIAR 2016: Image Analysis and Recognition pp 81–89Cite as

Sinogram Restoration Using Confidence Maps to Reduce Metal Artifact in Computed Tomography

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Part of the book series: Lecture Notes in Computer Science ((LNIP,volume 9730))

Abstract

Metal artifact reduction (MAR) is a well-known problem and lots of studies have been performed during the last decades. The common standard methods for MAR consist of synthesizing missing projection data by using an interpolation or in-painting process. However, no method has been yet proposed to solve MAR problem when no sinogram is available. This paper proposes a novel MAR approach using confidence maps to restore an artifacted sinogram computed directly from the reconstructed image.

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Authors and Affiliations

  1. LaBRI, University of Bordeaux, 351 Cours de la Libération, 33405, Talence, France

    Louis Frédérique, Jean-Philippe Domenger & Pascal Desbarats

  2. Inserm U1029 LAMC, University of Bordeaux, Allée Geoffroy Saint-Hillaire, Bat. B2, 33600, Pessac, France

    Benoit Recur

  3. Tomo Adour, Zone Europa, 5 Rue Johannes Kepler, 64000, Pau, France

    Louis Frédérique & Sylvain Genot

Authors
  1. Louis Frédérique
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  2. Benoit Recur
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  3. Sylvain Genot
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  4. Jean-Philippe Domenger
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  5. Pascal Desbarats
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Corresponding author

Correspondence to Louis Frédérique .

Editor information

Editors and Affiliations

  1. University of Porto, Porto, Portugal

    Aurélio Campilho

  2. Department of Electrical, University of Waterloo, Waterloo, Ontario, Canada

    Fakhri Karray

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© 2016 Springer International Publishing Switzerland

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Frédérique, L., Recur, B., Genot, S., Domenger, JP., Desbarats, P. (2016). Sinogram Restoration Using Confidence Maps to Reduce Metal Artifact in Computed Tomography. In: Campilho, A., Karray, F. (eds) Image Analysis and Recognition. ICIAR 2016. Lecture Notes in Computer Science(), vol 9730. Springer, Cham. https://doi.org/10.1007/978-3-319-41501-7_10

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  • DOI: https://doi.org/10.1007/978-3-319-41501-7_10

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  • Publisher Name: Springer, Cham

  • Print ISBN: 978-3-319-41500-0

  • Online ISBN: 978-3-319-41501-7

  • eBook Packages: Computer ScienceComputer Science (R0)

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