Abstract
Defect sizing using Distance Amplitude Correction (DAC) curves gets very time consuming when using phased array angle beam probes. For each incidence angle applied during testing a DAC/TCG curve has to be recorded. By changing the phasing angle important probe parameters such as near field length, delay line length and sensitivity are changed as well, resulting in a change of the DAC/TCG curve. DAC curves can be calculated using the new probe technology. It is sufficient to just measure one reference echo, e.g., using a calibration standard. The DAC curves for all angles can be calculated. Alternatively a DAC curve can be recorded using one single angle of the phased array angle beam probe. By recording the curve for one single angle the material characteristics of the reference block such as the sound attenuation are considered automatically. The DAC curve for all other angles are calculated with high accuracy. With the new probe technology recording DAC curves for phased array angle beam probes is as easy as recording a DAC curve with a single element angle beam probe.
This is a preview of subscription content, log in via an institution.
Buying options
Tax calculation will be finalised at checkout
Purchases are for personal use only
Learn about institutional subscriptionsReferences
Krautkramer, J., Krautkramer, H.: Ultrasonic testing of materials. In: 4th Fully Revised Edition Translation of the 5th Revised German Edition. Springer, Heidelberg GmbH (1990)
Vierke, J.: Empfindlichkeitseinstellung und Echohöhenbewertung von Prüfköpfen mit schmalen rechteckigen Schwingern, Diplomarbeit (2004)
Kleinert, W., Oberdörfer, Y.: Calculated bandwidth dependent DGS and DAC curves for phased array sizing. In: Proceedings ECNDT 2014 Prag. http://www.ndt.net/events/ECNDT2014/app/content/Paper/165_Kleinert.pdf
Author information
Authors and Affiliations
Corresponding author
Rights and permissions
Copyright information
© 2016 Springer International Publishing Switzerland
About this chapter
Cite this chapter
Kleinert, W. (2016). Bandwidth-Dependent DAC Curves. In: Defect Sizing Using Non-destructive Ultrasonic Testing. Springer, Cham. https://doi.org/10.1007/978-3-319-32836-2_9
Download citation
DOI: https://doi.org/10.1007/978-3-319-32836-2_9
Published:
Publisher Name: Springer, Cham
Print ISBN: 978-3-319-32834-8
Online ISBN: 978-3-319-32836-2
eBook Packages: Chemistry and Materials ScienceChemistry and Material Science (R0)