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Photorefractives for Holographic Interferometry and Nondestructive Testing

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Photorefractive Organic Materials and Applications

Part of the book series: Springer Series in Materials Science ((SSMATERIALS,volume 240))

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Abstract

Thanks to its high sensitivity to displacement, holography is very well suited for metrology. In the case of holographic interferometry (HI), interference occurs between the object wavefront and a wavefront reconstructed by a hologram allowing a comparison between different objects, or different states of the same object. This chapter first discusses the importance of HI compared to other techniques such as electronic or computer based interferometry, then the author is developing various methodologies for holographic metrology, including real time, double exposure, and time averaged HI. Material considerations are covered and the specific case of photorefractive polymer and crystals are analyzed. Several experiments of nondestructive testing on industrial systems are discussed with measurement configurations relevant for thermal analysis, vibration, defect detection, and even historic artifact investigation.

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Authors and Affiliations

  1. Université de Liège, Centre Spatial de Liège, Liege Science Park, Avenue du Pré Aily, Angleur (Liège), 4031, Belgium

    Marc Georges

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  1. Marc Georges
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Correspondence to Marc Georges .

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  1. College of Optical Sciences, The University of Arizona, Tucson, Arizona, USA

    Pierre-Alexandre Blanche

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Georges, M. (2016). Photorefractives for Holographic Interferometry and Nondestructive Testing. In: Blanche, PA. (eds) Photorefractive Organic Materials and Applications. Springer Series in Materials Science, vol 240. Springer, Cham. https://doi.org/10.1007/978-3-319-29334-9_8

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