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Synchrotron Light Sources and Free-Electron Lasers pp 1–26Cite as

SRLS Beam Instrumentation and Diagnostics

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General Introduction

Beam instrumentation and diagnostics for accelerator-based user facilities like synchrotron radiation light sources (SRLS) and free electron lasers (FELs) needs to provide a full set of measurement equipment for supporting all modes and states of operation. In this respect, the following major tasks and application areas of beam diagnostics can be identified:

  • Support of accelerator commissioning and user facility start-up by providing information about all relevant electron (or positron, possibly also photon) beam parameters within an extended dynamic range at reduced resolution and bandwidth.

  • Provision of online data about all relevant beam parameters to the operators in the control room and for the execution of automated measurement procedures, allowing day-by-day operation of a user facility in a reliable and reproducible manner. This may also include input to machine interlock and protection systems.

  • Provision of noninvasive beam measurements as inputs to a set...

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Author information

Authors and Affiliations

  1. Paul Scherrer Institut, 5232, Villigen, Switzerland

    Volker Schlott

Authors
  1. Volker Schlott
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Corresponding author

Correspondence to Volker Schlott .

Editor information

Editors and Affiliations

  1. Helmholtz-Zentrum Berlin, Berlin, Germany

    Eberhard Jaeschke

  2. Zentrum für Synchrotronstrahlung, TU Dortmund, Dortmund, Germany

    Shaukat Khan

  3. FS-CFEL-1, DESY, Hamburg, Germany

    Jochen R. Schneider

  4. SLAC National Accelerator Laboratory Linac Coherent Light Source, Stanford University, Menlo Park, California, USA

    Jerome B. Hastings

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© 2015 Springer International Publishing Switzerland

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Schlott, V. (2015). SRLS Beam Instrumentation and Diagnostics. In: Jaeschke, E., Khan, S., Schneider, J., Hastings, J. (eds) Synchrotron Light Sources and Free-Electron Lasers. Springer, Cham. https://doi.org/10.1007/978-3-319-04507-8_55-1

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  • DOI: https://doi.org/10.1007/978-3-319-04507-8_55-1

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  • Publisher Name: Springer, Cham

  • Online ISBN: 978-3-319-04507-8

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