Abstract
In this work, we present an analysis of bipolar effects in unipolar junctionless (JL) MOSFETs. The reason for dominant bipolar behavior in JL devices in comparison to inversion mode devices has been analyzed. Bipolar induced effects such as steep subthreshold slope, hysteresis in transfer and output characteristics, single transistor latch, and snapback are presented. Results will be useful for identifying advantages and challenges of JL transistors for dynamic memory applications.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
References
C-.W. Lee et al., Applied Physics Lett., vol. 94, 053511, 2009.
C.-W. Lee et al., Applied Physics Lett., vol. 96, 102106, 2010.
J.-P. Colinge et al., Nature Nanotech., vol. 5, pp. 225-229, 2010.
D. Ghosh et al., IEEE Electron Device Lett., vol. 33, pp. 1477-1479, 2012.
A. Kranti et al., Electronics Lett., vol. 46, pp. 1491-1493, 2010.
M.S. Parihar et al., IEEE Trans. Elect. Dev., vol. 60, pp. 1540-1546, 2013.
ATLAS Users Manual, Silvaco.
K.E. Moselund et al., Solid-State Electron., vol. 52, pp. 1336-1344, 2008.
Acknowledgments
This work is supported by the Science and Engineering Research Board, Department of Science and Technology, Government of India, under Grant SR/S3/EECS/0130/2011.
Author information
Authors and Affiliations
Corresponding author
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 2014 Springer International Publishing Switzerland
About this paper
Cite this paper
Parihar, M.S., Kranti, A. (2014). Bipolar Attributes of Unipolar Junctionless MOSFETs. In: Jain, V., Verma, A. (eds) Physics of Semiconductor Devices. Environmental Science and Engineering(). Springer, Cham. https://doi.org/10.1007/978-3-319-03002-9_42
Download citation
DOI: https://doi.org/10.1007/978-3-319-03002-9_42
Publisher Name: Springer, Cham
Print ISBN: 978-3-319-03001-2
Online ISBN: 978-3-319-03002-9
eBook Packages: Earth and Environmental ScienceEarth and Environmental Science (R0)