Abstract
Temperature dependence of the Shubnikov de Haas oscillation observed in the temperature range of 1.8–6 K due to doubly occupied subbands in the two-dimensional electron gas (2DEG) in AlGaN/GaN HEMT structures grown by MBE inhouse has been used to determine the effective mass m* using a novel method of nonlinear curve fitting method which is assigned to be more accurate which is reflected by the R-squared value of the fitting than discussed by previous workers using conventional approximation in linear-curve fitting model. Also the range in which the approximation of the conventional method is valid has been found out.
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References
L. Hsu, W. Walukiewicz, Phys. Rev. B, 56, 3 (1997)
A.Saxler, et.al MRS-Proceedings/Volume-595/1999
M. J. Manfra, S. H. Simon, K. W. Baldwin, A. M. Sergent, and K. W. West, R. J. Molnar and J. Caissie, Appl. Phy. Letters, VOL. 85, 22 (2004)
T. Y. Lin,et al, Phy. Rev. B,. 58, 20, (1998)
T. Hofmann, P. Kuhne, S. Schoche, Jr-Tai Chen, U. Forsberg, E. Janzen, N. Ben Sedrine, C. M. Herzinger, J. A. Woollam, M. Schubert, and V. Darakchieva, Appl. Phy. Letters, VOL. 101, 192102 (2012)
Acknowledgments
The corresponding author acknowledges the DST financial assistance received under the grant No.DST/INSPIRE Fellowship/2012/347. The Authors would like to thank Dr. Raghvendra Sahai Saxena, SSPL, Delhi for his useful contribution.
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Mishra, M.K., Manchanda, R., Lamba, S., Thakur, O.P., Sharma, R.K., Muralidharan, R. (2014). On the Determination of Electron Effective Mass in 2DEGs in Gallium Nitride HEMT Structures. In: Jain, V., Verma, A. (eds) Physics of Semiconductor Devices. Environmental Science and Engineering(). Springer, Cham. https://doi.org/10.1007/978-3-319-03002-9_24
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DOI: https://doi.org/10.1007/978-3-319-03002-9_24
Publisher Name: Springer, Cham
Print ISBN: 978-3-319-03001-2
Online ISBN: 978-3-319-03002-9
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