Abstract
In situ transmission electron microscopy provides dynamic observations of the physical behavior of materials in response to external stimuli such as temperature, gas environment, stress, and electric or magnetic fields. The goal of these experiments is to provide insight into atomic or nanoscale phenomena that are not easily accessed by other methods to inform our understanding of materials properties. In this chapter, we aim to demonstrate how in situ microscopy has enhanced our understanding of dynamic phenomena associated with phase transformations, catalysis, crystal growth, liquid-phase processes, electrical and mechanical properties, magnetism, and ferroelectricity. We also address dynamic processes induced by the electron beam, whether intentional or not. In many cases, in situ research is driven by developments in novel instrumentation and testing methodologies. We discuss how advances in aberration correction, sample preparation and manipulation, detector development, and data analysis enable new types of in situ experiments and provide fundamental insight into dynamic materials phenomena.
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Acknowledgements
Frances Ross would like to acknowledge the inspirational scientists with whom she has had the pleasure of working: her PhD advisor, the late Mike Stobbs, who emphasized quantitative information from TEM; Murray Gibson, Robert Hull, Uli Dahmen, and Ruud Tromp; and Mike McDonald, Mark Reuter and Arthur Ellis, whose outstanding technical help made the in situ experiments possible; also the IBM T.J. Watson Research Center with its far-sighted view of basic research, her many collaborators, and her family for their patience and support. Andrew Minor would like to thank his scientific mentors who over the years have guided and supported him, including J.W. Morris, Jr., Eric Stach, and Uli Dahmen. In addition, he appreciates all of the students, postdocs, collaborators, and funding sources who have enabled him to work in the exciting field of in situ electron microscopy. Lastly, he is grateful for the love and support of his family.
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Ross, F.M., Minor, A.M. (2019). In Situ Transmission Electron Microscopy. In: Hawkes, P.W., Spence, J.C.H. (eds) Springer Handbook of Microscopy. Springer Handbooks. Springer, Cham. https://doi.org/10.1007/978-3-030-00069-1_3
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