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Scanning Tunneling Microscopy in Surface Science

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Springer Handbook of Microscopy

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Abstract

This chapter discusses the use of scanning tunneling microscopy (STM) in surface science. Basic principles of STM imaging are introduced, and the imaging methodology is discussed, along with practical and instrumentation requirements. The approach taken in surface imaging by STM is illustrated by the example of silicon surfaces. An application of STM that has gained ever-increasing importance is discussed in detail: atomic-scale spectroscopy. A survey of the spectroscopic capabilities of STM is provided, and a variety of techniques for local spectroscopy and spectroscopic imaging are introduced. In addition, pathways toward obtaining chemical and element specificity at the atomic scale—traditionally a weakness of STM—are discussed. The extension of the operating conditions of STM to high and low temperatures has opened up new avenues of investigation. Here, variable-temperature STM of dynamic surface processes is discussed, as well as manipulation of atoms and molecules at cryogenic temperatures. Examples of STM imaging and spectroscopy on subsurface structures include the use of ballistic electrons to probe buried interfaces, and cross-sectional STM on cleavage faces of III/V semiconductors to image embedded nanostructures. The chapter concludes with a brief discussion of STM image simulation techniques.

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References

  • G. Binnig, H. Rohrer, C. Gerber, E. Weibel: Tunneling through a controllable vacuum gap, Appl. Phys. Lett. 40, 178 (1982)

    CAS  Google Scholar 

  • G. Binnig, H. Rohrer, C. Gerber, E. Weibel: \(7\times 7\) reconstruction on Si(111) resolved in real space, Phys. Rev. Lett. 50, 120 (1983)

    CAS  Google Scholar 

  • E.W. Müller, T.T. Tsong: Field Ion Microscopy (Elsevier, New York 1969)

    Google Scholar 

  • E. Bauer: LEEM basics, Surf. Rev. Lett. 5, 1275 (1998)

    CAS  Google Scholar 

  • J.A. Venables: Introduction to Surface and Thin Film Processes (Cambridge Univ. Press, Cambridge 2000)

    Google Scholar 

  • K. Yagi: Surface studies by ultrahigh-vacuum transmission and reflection electron-microscopy, Scanning Electron Microsc. 4, 1421 (1982)

    Google Scholar 

  • A. Cerezo, D.J. Larson, G.D.W. Smith: Progress in the atomic-scale analysis of materials with the three-dimensional atom probe, MRS Bulletin 26, 102 (2001)

    CAS  Google Scholar 

  • C.J. Chen: Introduction to Scanning Tunneling Microscopy (Oxford Univ. Press, Oxford 1993)

    Google Scholar 

  • R. Wiesendanger: Scanning Probe Microscopy and Spectroscopy—Methods and Applications (Cambridge Univ. Press, Cambridge 1994)

    Google Scholar 

  • H.-J. Güntherodt, R. Wiesendanger (Eds.): Scanning Tunneling Microscopy, Vol. I/II (Springer, Berlin 1992)

    Google Scholar 

  • D.A. Bonnell (Ed.): Scanning Probe Microscopy and Spectroscopy—Theory, Techniques, and Applications, 2nd edn. (Wiley-VCH, New York 2001)

    Google Scholar 

  • Y. Kuk, P.J. Silverman: Role of tip structure in scanning tunneling microscopy, Appl. Phys. Lett. 48, 1597 (1986)

    CAS  Google Scholar 

  • G.P. Kochanski: Nonlinear alternating-current tunneling microscopy, Phys. Rev. Lett. 62, 2285 (1989)

    CAS  Google Scholar 

  • A.A. Gewirth, B.K. Niece: Electrochemical applications of in situ scanning probe microscopy, Chem. Rev. 97, 1129 (1997)

    CAS  Google Scholar 

  • K.M. Robinson, I.K. Robinson, W.E. O'Grady: Structure of Au(100) and Au(111) single crystals surfaces prepared by flame annealing, Surf. Sci. 262, 387 (1992)

    CAS  Google Scholar 

  • D.P.E. Smith, G. Binnig: Ultrasmall scanning tunneling microscope for use in a liquid-helium storage dewar, Rev. Sci. Instrum. 57, 2630 (1986)

    Google Scholar 

  • G. Binnig, D.P.E. Smith: Single-tube three-dimensional scanner for scanning tunneling microscopy, Rev. Sci. Instrum. 57, 1688 (1986)

    CAS  Google Scholar 

  • S.C. Erwin, A.A. Baski, L.J. Whitman: Structure and stability of Si(114)–(\(2\times 1\)), Phys. Rev. Lett. 77, 687 (1996)

    CAS  Google Scholar 

  • U. Diebold: The surface science of titanium dioxide, Surf. Sci. Rep. 48, 53 (2003)

    CAS  Google Scholar 

  • K. Meinel, H. Wolter, C. Ammer, A. Beckmann, H. Neddermeyer: Adsorption stages of O on Ru(0001) studied by means of scanning tunnelling microscopy, J. Phys. Condens. Matter 9, 4611 (1997)

    CAS  Google Scholar 

  • D.D. Chambliss, R.J. Wilson, S. Chiang: The use of STM to study metal film epitaxy, IBM J. Res. Dev. 39, 639 (1995)

    CAS  Google Scholar 

  • J.J. Boland, J.H. Weaver: A surface view of etching, Phys. Today 51, 34 (1998)

    CAS  Google Scholar 

  • K. Nakayama, J.H. Weaver: Electron-stimulated modification of Si surfaces, Phys. Rev. Lett. 82, 980 (1999)

    CAS  Google Scholar 

  • Y. Chen, D.A.A. Ohlberg, G. Medeiros-Ribeiro, Y.A. Chang, R.S. Williams: Self-assembled growth of epitaxial erbium disilicide nanowires on silicon (001), Appl. Phys. Lett. 76, 4004 (2000)

    CAS  Google Scholar 

  • J.K. Gimzewski, C. Joachim, R.R. Schlittler, V. Langlais, H. Tang, I. Johannsen: Rotation of a single molecule within a supramolecular bearing, Science 281, 531 (1998)

    CAS  Google Scholar 

  • S. Schintke, W.-D. Schneider: Insulators at the ultrathin limit: Electronic structure studied by scanning tunnelling microscopy and scanning tunnelling spectroscopy, J. Phys. Condens. Matter 16, R49 (2004)

    CAS  Google Scholar 

  • M.T. Cygan, T.D. Dunbar, J.J. Arnold, L.A. Bumm, N.F. Shedlock, T.P. Burgin, L. Jones, D.L. Allara, J.M. Tour, P.S. Weiss: Insertion, conductivity, and structures of conjugated organic oligomers in self-assembled alkanethiol monolayers on Au{111}, J. Am. Chem. Soc. 120, 2721 (1998)

    CAS  Google Scholar 

  • G. Binnig, H. Rohrer: Scanning tunneling microscopy, Surf. Sci. 126, 236 (1983)

    CAS  Google Scholar 

  • R.M. Tromp, R.J. Hamers, J.E. Demuth: Si(001) dimer structure observed with scanning tunneling microscopy, Phys. Rev. Lett. 55, 1303 (1985)

    CAS  Google Scholar 

  • B.S. Swartzentruber, Y.-W. Mo, R. Kariotis, M.G. Lagally, M.B. Webb: Direct determination of step and kink energies on vicinal Si(001), Phys. Rev. Lett. 65, 1913 (1990)

    CAS  Google Scholar 

  • F.K. Men, W.E. Packard, M.B. Webb: Si(100) surface under an externally applied stress, Phys. Rev. Lett. 61, 2469 (1988)

    CAS  Google Scholar 

  • Y.-N. Yang, E.S. Fu, E.D. Williams: An STM study of current-induced step bunching on Si(111), Surf. Sci. 356, 101 (1996)

    CAS  Google Scholar 

  • Z. Gai, X. Li, R.G. Zhao, W.S. Yang: Atomic structure of the Ge(15 3 23) surface, Phys. Rev. B 57, 15060 (1998)

    Google Scholar 

  • R.J. Hamers, R.M. Tromp, J.E. Demuth: Surface electronic structure of Si (111)-(\(7\times 7\)) resolved in real space, Phys. Rev. Lett. 56, 1972 (1986)

    CAS  Google Scholar 

  • K. Takayanagi, Y. Tanishiro, S. Takahashi, M. Takahashi: Structure analysis of Si(111)-\(7\times 7\) reconstructed surface by transmission electron diffraction, Surf. Sci. 164, 367 (1985)

    CAS  Google Scholar 

  • J.J. Boland: Manipulating chlorine atom bonding on the Si(100)-(\(2\times 1\)) surface with the STM, Science 262, 1703 (1993)

    CAS  Google Scholar 

  • A. Laracuente, L.J. Whitman: Step structures and energies on monohydride-terminated vicinal Si(001) surfaces, Surf. Sci. 476, L247 (2001)

    CAS  Google Scholar 

  • Y. Wang, X. Chen, R.J. Hamers: Atomic-resolution study of overlayer formation and interfacial mixing in the interaction of phosphorus with Si(001), Phys. Rev. B 50, 4534 (1994)

    CAS  Google Scholar 

  • Y. Wang, M.J. Bronikowski, R.J. Hamers: An atomically resolved scanning tunneling microscopy study of the thermal decomposition of disilane on Si(001), Surf. Sci. 311, 64 (1994)

    CAS  Google Scholar 

  • R.A. Wolkow: Controlled molecular adsorption on silicon: Laying a foundation for molecular devices, Annu. Rev. Phys. Chem. 50, 413 (1999)

    CAS  Google Scholar 

  • A.J. Mayne, A.R. Avery, J. Knall, T.S. Jones, G.A.D. Briggs, W.H. Weinberg: An STM study of the chemisorption of C2H4 on Si(001)(\(2\times 1\)), Surf. Sci. 284, 247 (1993)

    CAS  Google Scholar 

  • L. Li, C. Tindall, O. Takaoka, Y. Hasegawa, T. Sakurai: STM study of C2H2 adsorption on Si(001), Phys. Rev. B 56, 4648 (1997)

    CAS  Google Scholar 

  • G.P. Lopinski, D.J. Moffatt, D.D.M. Wayner, R.A. Wolkow: Determination of the absolute chirality of individual adsorbed molecules using the scanning tunnelling microscope, Nature 392, 909 (1998)

    CAS  Google Scholar 

  • J.S. Hovis, R.J. Hamers: Cycloaddition chemistry and formation of ordered organic monolayers on silicon (001) surfaces, Surf. Sci. 402–404, 1 (1997)

    Google Scholar 

  • M. Kasaya, H. Tabata, T. Kawai: Scanning tunneling microscopy and molecular orbital calculation of pentacene molecules adsorbed on the Si(100)\(2{\times}1\) surface, Surf. Sci. 400, 367 (1998)

    CAS  Google Scholar 

  • B. Borovski, M. Krueger, E. Ganz: Metastable adsorption of benzene on the Si(001) surface, Phys. Rev. B 57, 4269 (1998)

    Google Scholar 

  • Z.Y. Zhang, M.G. Lagally: Atomistic processes in the early stages of thin-film growth, Science 276, 377 (1998)

    Google Scholar 

  • Y.-W. Mo, J. Kleiner, M.B. Webb, M.G. Lagally: Activation energy for surface diffusion of Si on Si(001): A scanning-tunneling-microscopy study, Phys. Rev. Lett. 66, 1998 (1991)

    CAS  Google Scholar 

  • Y.-W. Mo, B.S. Swartzentruber, R. Kariotis, M.B. Webb, M.G. Lagally: Growth and equilibrium structures in the epitaxy of Si on Si(001), Phys. Rev. Lett. 63, 2393 (1989)

    CAS  Google Scholar 

  • M. Horn-von Hoegen: Surfactants: Perfect heteroepitaxy of Ge on Si(111), Appl. Phys. A 59, 503 (1994)

    Google Scholar 

  • X.R. Qin, M.G. Lagally: Adatom pairing structures for Ge on Si(100): The initial stage of island formation, Science 278, 1444 (1997)

    CAS  Google Scholar 

  • P. Sutter, I. Schick, W. Ernst, E. Sutter: Initial surface roughening in Ge/Si(001) heteroepitaxy driven by step-vacancy line interaction, Phys. Rev. Lett. 91, 176102 (2003)

    CAS  Google Scholar 

  • E. Sutter, P. Sutter, J.E. Bernard: Extended shape evolution of low mismatch Si1–xGex alloy islands on Si(100), Appl. Phys. Lett. 84, 2262 (2004)

    CAS  Google Scholar 

  • Y.-W. Mo, D.E. Savage, B.S. Swartzentruber, M.G. Lagally: Kinetic pathway in Stranski-Krastanov growth of Ge on Si(001), Phys. Rev. Lett. 65, 1020 (1990)

    CAS  Google Scholar 

  • G. Medeiros-Ribeiro, A.M. Bratkovski, T.I. Kamins, D.A.A. Ohlberg, R.S. Williams: Shape transition of germanium nanocrystals on a silicon (001) surface from pyramids to domes, Science 279, 353 (1998)

    CAS  Google Scholar 

  • R.J. Hamers: Atomic-resolution surface spectroscopy with the scanning tunneling microscope, Annu. Rev. Phys. Chem. 40, 531 (1989)

    CAS  Google Scholar 

  • R.S. Becker, B.S. Swartzentruber, J.S. Vickers, T. Klitsner: Dimer–adatom–stacking-fault (DAS) and non-DAS (111) semiconductor surfaces: A comparison of Ge(111)-c(\(2\times 8\)) to Si(111)-(\(2\times 2\)), -(\(5\times 5\)), -(\(7\times 7\)), and -(\(9\times 9\)) with scanning tunneling microscopy, Phys. Rev. B 39, 1633 (1989)

    CAS  Google Scholar 

  • E. Bauer: Low energy electron microscopy, Rep. Prog. Phys. 57, 895 (1994)

    CAS  Google Scholar 

  • G. Nunes Jr., N.M. Amer: Atomic resolution scanning tunneling microscopy with a gallium arsenide tip, Appl. Phys. Lett. 63, 1851 (1993)

    CAS  Google Scholar 

  • P. Sutter, P. Zahl, E. Sutter, J.E. Bernard: Energy-filtered scanning tunneling microscopy using a semiconductor tip, Phys. Rev. Lett. 90, 166101 (2003)

    CAS  Google Scholar 

  • R.M. Feenstra, J.A. Stroscio, J. Tersoff, A.P. Fein: Atom-selective imaging of the GaAs(110) surface, Phys. Rev. Lett. 58, 1192 (1987)

    CAS  Google Scholar 

  • P. Ebert, G. Cox, U. Poppe, K. Urban: The electronic structure of the InP(110) surface studied by scanning tunneling microscopy and spectroscopy, Surf. Sci. 271, 587 (1992)

    CAS  Google Scholar 

  • D.J. Hornbaker, S.-J. Kahng, S. Misra, B.W. Smith, A.T. Johnson, E.J. Mele, D.E. Luzzi, A. Yazdani: Mapping the one-dimensional electronic states of nanotube peapod structures, Science 295, 828 (2002)

    CAS  Google Scholar 

  • J.N. Crain, D.T. Pierce: End states in one-dimensional atom chains, Science 307, 703 (2005)

    CAS  Google Scholar 

  • J. Repp, G. Meyer, S.M. Stojkovic, A. Gourdon, C. Joachim: Molecules on insulating films: Scanning-tunneling microscopy imaging of individual molecular orbitals, Phys. Rev. Lett. 94, 026803 (2005)

    Google Scholar 

  • M.F. Crommie, C.P. Lutz, D.M. Eigler: Imaging standing waves in a two-dimensional electron gas, Nature 363, 524 (1993)

    CAS  Google Scholar 

  • Y. Hasegawa, P. Avouris: Direct observation of standing wave formation at surface steps using scanning tunneling spectroscopy, Phys. Rev. Lett. 71, 1071 (1993)

    CAS  Google Scholar 

  • C. Wittneven, R. Dombrowski, M. Morgenstern, R. Wiesendanger: Scattering states of ionized dopants probed by low temperature scanning tunneling spectroscopy, Phys. Rev. Lett. 81, 5616 (1998)

    CAS  Google Scholar 

  • J.E. Hoffman, K. McElroy, D.-H. Lee, K.M. Lang, H. Eisaki, S. Uchida, J.C. Davis: Imaging quasiparticle interference in Bi2Sr2CaCu2O8+δ, Science 297, 1148 (2002)

    CAS  Google Scholar 

  • M. Vershinin, S. Misra, S. Ono, Y. Abe, Y. Ando, A. Yazdani: Local ordering in the pseudogap state of the high-Tc superconductor Bi2Sr2CaCu2O8$$+\delta$$, Science 303, 1995 (2004)

    CAS  Google Scholar 

  • T. Hanaguri, C. Lupien, Y. Kohsaka, D.-H. Lee, M. Azuma, M. Takano, H. Takagi, J.C. Davis: A ‘checkerboard’ electronic crystal state in lightly hole-doped Ca2–xNaxCuO2Cl2, Nature 430, 1001 (2004)

    CAS  Google Scholar 

  • J.E. Hoffman, E.W. Hudson, K.M. Lang, V. Madhavan, H. Eisaki, S. Uchida, J.C. Davis: A four unit cell periodic pattern of quasi-particle states surrounding vortex cores in Bi2Sr2CaCu2O8$$+\delta$$, Science 295, 466 (2002)

    CAS  Google Scholar 

  • M. Bode, M. Getzlaff, R. Wiesendanger: Spin-polarized vacuum tunneling into the exchange-split surface state of Gd(0001), Phys. Rev. Lett. 81, 4256 (1998)

    CAS  Google Scholar 

  • S. Heinze, M. Bode, A. Kubetzka, O. Pietzsch, X. Nie, S. Blügel, R. Wiesendanger: Real-space imaging of two-dimensional antiferromagnetism on the atomic scale, Science 288, 1805 (2000)

    CAS  Google Scholar 

  • O. Pietzsch, A. Kubetzka, M. Bode, R. Wiesendanger: Observation of magnetic hysteresis at the nanometer scale by spin-polarized scanning tunneling spectroscopy, Science 292, 2053 (2001)

    CAS  Google Scholar 

  • R.C. Jaklevic, J. Lambe: Molecular vibration spectra by electron tunneling, Phys. Rev. Lett. 17, 1139 (1966)

    CAS  Google Scholar 

  • B.C. Stipe, M.A. Rezaei, W. Ho: Single-molecule vibrational spectroscopy and microscopy, Science 280, 1732 (1998)

    CAS  Google Scholar 

  • G. Binnig, N. Garcia, H. Rohrer: Conductivity sensitivity of inelastic scanning tunneling microscopy, Phys. Rev. B 32, 1336 (1985)

    CAS  Google Scholar 

  • S. Gregory: Inelastic tunneling spectroscopy and single-electron tunneling in an adjustable microscopic tunnel junction, Phys. Rev. Lett. 64, 689 (1990)

    CAS  Google Scholar 

  • U. Weierstall, J. Spence: Atomic species identification in STM using an imaging atom-probe technique, Surf. Sci. 398, 267 (1998)

    CAS  Google Scholar 

  • F. Festy, R.E. Palmer: Scanning probe energy loss spectroscopy below 50 nm resolution, Appl. Phys. Lett. 85, 5034 (2004)

    CAS  Google Scholar 

  • C. Nagl, O. Haller, E. Platzgummer, M. Schmid, P. Varga: Submonolayer growth of Pb on Cu( 111): Surface alloying and de-alloying, Surf. Sci. 321, 237 (1994)

    CAS  Google Scholar 

  • P.T. Wouda, M. Schmid, B.E. Nieuwenhuys, P. Varga: STM study of the (111) and (100) surfaces of PdAg, Surf. Sci. 417, 292 (1998)

    CAS  Google Scholar 

  • P.T. Wouda, B.E. Niewenhuys, M. Schmid, P. Varga: Chemically resolved STM on a PtRh(100) surface, Surf. Sci. 359, 17 (1996)

    CAS  Google Scholar 

  • M. Kawamura, N. Paul, V. Cherepanov, B. Voigtländer: Nanowires and nanorings at the atomic level, Phys. Rev. Lett. 91, 096102 (2003)

    Google Scholar 

  • G. Meyer, K.-H. Rieder: Controlled manipulation of single atoms and small molecules with the scanning tunneling microscope, Surf. Sci. 377–379, 1087 (1997)

    Google Scholar 

  • B. Voigtlander: Fundamental processes in Si/Si and Ge/Si epitaxy studied by scanning tunneling microscopy during growth, Surf. Sci. Rep. 43, 127 (2001)

    CAS  Google Scholar 

  • L. Kuipers, M.S. Hoogeman, J.W.M. Frenken: Step dynamics on Au(110) studied with a high-temperature, high-speed scanning tunneling microscope, Phys. Rev. Lett. 71, 3517 (1993)

    CAS  Google Scholar 

  • B. Voigtlander, A. Zinner: Simultaneous molecular beam epitaxy growth and scanning tunneling microscopy imaging during Ge/Si epitaxy, Appl. Phys. Lett. 63, 3055 (1993)

    Google Scholar 

  • B. Borovski, M. Krueger, E. Ganz: Diffusion of the silicon dimer on Si(001): New possibilities at 450 K, Phys. Rev. Lett. 78, 4229 (1997)

    Google Scholar 

  • S. Horch, H.T. Lorensen, S. Helveg, E. Lægsgaard, I. Stensgaard, K.W. Jacobsen, J.K. Norskov, F. Besenbacher: Enhancement of surface self-diffusion of platinum atoms by adsorbed hydrogen, Nature 398, 134 (1999)

    CAS  Google Scholar 

  • J. Wintterlin, J. Trost, S. Renisch, R. Schuster, T. Zambelli, G. Ertl: Real-time STM observations of atomic equilibrium fluctuations in an adsorbate system: O/Ru(0001), Surf. Sci. 394, 159 (1997)

    CAS  Google Scholar 

  • M. Schunack, T.R. Linderoth, F. Rosei, E. Laegsgaard, I. Stensgaard, F. Besenbacher: Long jumps in the surface diffusion of large molecules, Phys. Rev. Lett. 88, 156102 (2002)

    CAS  Google Scholar 

  • R.M. Tromp: Low-energy electron microscopy, IBM J. Res. Dev. 44, 503 (2000)

    CAS  Google Scholar 

  • M.J. Rost, L. Crama, P. Schakel, E. van Tol, G.B.E.M. van Velzen-Williams, C.F. Overgauw, H. ter Horst, H. Dekker, B. Okhuijsen, M. Seynen, A. Vijftigschild, P. Han, A.J. Katan, K. Schoots, R. Schumm, W. van Loo, T.H. Oosterkamp, J.W.M. Frenken: Scanning probe microscopes go video rate and beyond, Rev. Sci. Instrum. 76, 053710 (2005)

    Google Scholar 

  • P.B. Rasmussen, B.L.M. Hendriksen, H. Zeijlemaker, H.G. Ficke, J.W.M. Frenken: The reactor STM: A scanning tunneling microscope for investigation of catalytic surfaces at semi-industrial reaction conditions, Rev. Sci. Instrum. 69, 3879 (1998)

    CAS  Google Scholar 

  • J.A. Jensen, K.B. Rider, Y. Chen, M. Salmeron, G.A. Somorjai: High pressure, high temperature scanning tunneling microscopy, J. Vac. Sci. Technol. B 17, 1080 (1999)

    CAS  Google Scholar 

  • E. Lægsgaard, L. Österlund, P.B. Rasmussen, I. Stensgaard, F. Besenbacher: A high-pressure scanning tunneling microscope, Rev. Sci. Instrum. 72, 3537 (2001)

    Google Scholar 

  • M. Röfiler, P. Geng, J. Wintterlin: A high-pressure scanning tunneling microscope for studying heterogeneous catalysis, Rev. Sci. Instrum. 76, 023705 (2005)

    Google Scholar 

  • B.L.M. Hendriksen, J.W.M. Frenken: CO oxidation on Pt(110): Scanning tunneling microscopy inside a high-pressure flow reactor, Phys. Rev. Lett. 89, 046101 (2002)

    CAS  Google Scholar 

  • B.S. Swartzentruber: Direct measurement of surface diffusion using atom-tracking scanning tunneling microscopy, Phys. Rev. Lett. 76, 459 (1996)

    CAS  Google Scholar 

  • X.R. Qin, B.S. Swartzentruber, M.G. Lagally: Diffusional kinetics of SiGe dimers on Si(100) using atom-tracking scanning tunneling microscopy, Phys. Rev. Lett. 85, 3660 (2000)

    CAS  Google Scholar 

  • T. Mitsui, M.K. Rose, E. Fomin, D.F. Ogletree, M. Salmeron: Water diffusion and clustering on Pd(111), Science 297, 1850 (2002)

    CAS  Google Scholar 

  • M.L. Grant, B.S. Swartzentruber, N.C. Bartelt, J.B. Hannon: Diffusion kinetics in the Pd/Cu(001) surface alloy, Phys. Rev. Lett. 86, 4588 (2001)

    CAS  Google Scholar 

  • L.M. Sanders, R. Stumpf, T.R. Mattson, B.S. Swartzentruber: Changing the diffusion mechanism of Ge-Si dimers on Si(001) using an electric field, Phys. Rev. Lett. 91, 206104 (2003)

    CAS  Google Scholar 

  • S.-W. Hla, K.-H. Rieder: STM control of chemical reactions: Single-molecule synthesis, Annu. Rev. Phys. Chem. 54, 307 (2003)

    CAS  Google Scholar 

  • D.M. Eigler, E.K. Schweizer: Positioning single atoms with a scanning tunnelling microscope, Nature 344, 524 (1990)

    CAS  Google Scholar 

  • H.J. Lee, W. Ho: Single-bond formation and characterization with a scanning tunneling microscope, Science 286, 1719 (1999)

    CAS  Google Scholar 

  • G.V. Nazin, X.H. Qiu, W. Ho: Visualization and spectroscopy of a metal-molecule-metal bridge, Science 302, 77 (2003)

    CAS  Google Scholar 

  • A.J. Heinrich, C.P. Lutz, J.A. Gupta, D.M. Eigler: Molecule cascades, Science 298, 1381 (2002)

    CAS  Google Scholar 

  • J. Repp, G. Meyer, F.E. Olsson, M. Persson: Controlling the charge state of individual gold adatoms, Science 305, 493 (2004)

    CAS  Google Scholar 

  • G. Meyer, K.-H. Rieder: Lateral manipulation of single adsorbates and substrate atoms with the scanning tunneling microscope, MRS Bulletin 23, 28 (1998)

    CAS  Google Scholar 

  • T. Komeda, Y. Kim, M. Kawai, B.N.J. Persson, H. Ueba: Lateral hopping of molecules induced by excitation of internal vibration mode, Science 295, 2055 (2002)

    CAS  Google Scholar 

  • J.A. Stroscio, R.J. Celotta: Controlling the dynamics of a single atom in lateral atom manipulation, Science 306, 242 (2004)

    CAS  Google Scholar 

  • B.C. Stipe, M.A. Rezaei, W. Ho: Inducing and viewing the rotational motion of a single molecule, Science 279, 1907 (1998)

    CAS  Google Scholar 

  • W.J. Kaiser, L.D. Bell: Direct investigation of subsurface interface electronic structure by ballistic-electron-emission microscopy, Phys. Rev. Lett. 60, 1406 (1988)

    CAS  Google Scholar 

  • V. Narayanamurti, M. Kozhevnikov: BEEM imaging and spectroscopy of buried structures in semiconductors, Phys. Rep. 349, 447 (2001)

    CAS  Google Scholar 

  • L.D. Bell, W.J. Kaiser, M.H. Hecht, L.C. Davis: New electron and hole spectroscopies based on ballistic electron emission microscopy, J. Vac. Sci. Technol. B 9, 594 (1991)

    Google Scholar 

  • L.D. Bell, M.H. Hecht, W.J. Kaiser, L.C. Davis: Direct spectroscopy of electron and hole scattering, Phys. Rev. Lett. 64, 2679 (1990)

    CAS  Google Scholar 

  • M. Prietsch, R. Ludeke: Ballistic-electron-emission microscopy and spectroscopy of GaP(110)-metal interfaces, Phys. Rev. Lett. 66, 2511 (1991)

    CAS  Google Scholar 

  • A.E. Fowell, R.H. Williams, B.E. Richardson, T.-H. Shen: The Au/CdTe interface: An investigation of electrical barriers by ballistic electron emission microscopy, Semicond. Sci. Technol. 5, 348 (1990)

    CAS  Google Scholar 

  • H. Sirringhaus, E.Y. Lee, H. von Kanel: Hot carrier scattering at interfacial dislocations observed by ballistic-electron-emission microscopy, Phys. Rev. Lett. 73, 577 (1994)

    CAS  Google Scholar 

  • M.E. Rubin, G. Medeiros-Ribeiro, J.J. O'Shea, M.A. Chin, E.Y. Lee, P.M. Petroff, V. Narayanamurti: Imaging and spectroscopy of single InAs self-assembled quantum dots using ballistic electron emission microscopy, Phys. Rev. Lett. 77, 5268 (1996)

    CAS  Google Scholar 

  • C. Troadec, L. Kunardi, N. Chandrasekhar: Ballistic emission spectroscopy and imaging of a buried metal/organic interface, Appl. Phys. Lett. 86, 72101 (2005)

    Google Scholar 

  • C. Eder, J. Smoliner, G. Strasser: Local barrier heights on quantum wires determined by ballistic electron emission microscopy, Appl. Phys. Lett. 68, 2876 (1996)

    CAS  Google Scholar 

  • T. Sajoto, J.J. O'Shea, S. Bhargava, D. Leonard, M.A. Chin, V. Narayanamurti: Direct observation of quasi-bound states and band-structure effects in a double barrier resonant tunneling structure using ballistic electron emission microscopy, Phys. Rev. Lett. 74, 3427 (1995)

    CAS  Google Scholar 

  • R. Heer, J. Smoliner, G. Strasser, E. Gornik: Ballistic electron emission microscopy on biased GaAs-AlGaAs superlattices, Appl. Phys. Lett. 73, 3138 (1998)

    CAS  Google Scholar 

  • M.T. Cuberes, A. Bauer, H.J. Wen, D. Vandré, M. Prietsch, G. Kaindl: Ballistic-electron emission microscopy on the Au/n-Si(111)\(7\times 7\) interface, J. Vac. Sci. Technol. B 12, 2422 (1994)

    CAS  Google Scholar 

  • W.H. Rippard, R.A. Buhrmann: Spin-dependent hot electron transport in Co/Cu thin films, Phys. Rev. Lett. 84, 971 (2000)

    CAS  Google Scholar 

  • R.C. Jaklevic, J. Lambe, M. Mikkor, W.C. Vassell: Observation of electron standing waves in a crystalline box, Phys. Rev. Lett. 26, 88 (1971)

    CAS  Google Scholar 

  • I.B. Altfeder, K.A. Matveev, D.M. Chen: Electron fringes on a quantum wedge, Phys. Rev. Lett. 78, 2815 (1997)

    CAS  Google Scholar 

  • E.Y. Lee, H. Sirringhaus, H. von Kanel: Scanning-tunneling-microscopy investigation of the quantum-size effect in epitaxial CoSi2/Si(111), Phys. Rev. B 50, 5807 (1994)

    CAS  Google Scholar 

  • J.A. Kubby, W.J. Greene: Electron interferometry at a metal-semiconductor interface, Phys. Rev. Lett. 68, 329 (1992)

    CAS  Google Scholar 

  • I.B. Altfeder, D.M. Chen, K.A. Matveev: Imaging buried interfacial lattices with quantized electrons, Phys. Rev. Lett. 80, 4895 (1998)

    CAS  Google Scholar 

  • H. Salemink, O. Albrektsen: Tunneling microscopy and spectroscopy on cross sections of molecular-beam-epitaxy-grown (Al)GaAs multilayers, J. Vac. Sci. Technol. B 9, 779 (1991)

    CAS  Google Scholar 

  • R.M. Feenstra, D.A. Collins, D.Z.-Y. Ting, M.W. Wang, T.C. McGill: Interface roughness and asymmetry in InAs/GaSb superlattices studied by scanning tunneling microscopy, Phys. Rev. Lett. 72, 2749 (1994)

    CAS  Google Scholar 

  • R.S. Goldman, R.M. Feenstra, B.G. Briner, M.L. O’Steen, R.J. Hauenstein: Atomic-scale structure and electronic properties of GaN/GaAs superlattices, Appl. Phys. Lett. 69, 3698 (1996)

    CAS  Google Scholar 

  • B. Legrand, B. Grandidier, J.P. Nys, D. Stiévenard, J.M. Gërard, V. Thierry-Mieg: Scanning tunneling microscopy and scanning tunneling spectroscopy of self-assembled InAs quantum dots, Appl. Phys. Lett. 73, 96 (1998)

    CAS  Google Scholar 

  • D.M. Bruls, J.W.A.M. Vugs, P.M. Koenraad, H.W.M. Salemink, J.H. Wolter, M. Hopkinson, M.S. Skolnick, F. Long, S.P.A. Gill: Determination of the shape and indium distribution of low-growth-rate InAs quantum dots by cross-sectional scanning tunneling microscopy, Appl. Phys. Lett. 81, 1708 (2002)

    CAS  Google Scholar 

  • Q. Gong, P. Offermans, R. Notzel, P.M. Koenraod, J.H. Loolter: Capping process of InAs/GaAs quantum dots studied by cross-sectional scanning tunneling microscopy, Appl. Phys. Lett. 85, 5697 (2004)

    CAS  Google Scholar 

  • J.F. Zheng, X. Liu, N. Newman, E.R. Weber, D.F. Ogletree, M. Salmeron: Scanning tunneling microscopy studies of Si donors (SiGa) in GaAs, Phys. Rev. Lett. 72, 1490 (1994)

    CAS  Google Scholar 

  • M. Pfister, M.B. Johnson, S.F. Alvarado, H.W.M. Salemink, U. Marti, D. Martin, F. Morier-Genoud, F.K. Reinhard: Indium distribution in InGaAs quantum wires observed with the scanning tunneling microscope, Appl. Phys. Lett. 67, 1459 (1995)

    CAS  Google Scholar 

  • J.H. Davies, D.M. Bruls, J.W.A.M. Vugs, P.M. Koenraad: Relaxation of a strained quantum well at a cleaved surface, J. Appl. Phys. 91, 4171 (2002)

    CAS  Google Scholar 

  • M.B. Johnson, O. Albrektsen, R.M. Feenstra, H.W.M. Salemink: Direct imaging of dopants in GaAs with cross-sectional scanning tunneling microscopy, Appl. Phys. Lett. 63, 2923 (1993)

    CAS  Google Scholar 

  • A.M. Yakunin, A.Y. Silov, P.M. Koenraad, J.H. Wolter, W. Van Roy, J. De Boeck, J.-M. Tang, M.E. Flatté: Spatial structure of an individual Mn acceptor in GaAs, Phys. Rev. Lett. 92, 216806 (2004)

    CAS  Google Scholar 

  • J.-M. Tang, M.E. Flatté: Multiband tight-binding model of local magnetism in Ga1–xMnxAs, Phys. Rev. Lett. 92, 047201 (2004)

    Google Scholar 

  • J. Tersoff, D.R. Hamann: Theory and application for the scanning tunneling microscope, Phys. Rev. Lett. 50, 1998 (1983)

    CAS  Google Scholar 

  • J. Tersoff, D.R. Hamann: Theory of the scanning tunneling microscope, Phys. Rev. B 31, 805 (1985)

    CAS  Google Scholar 

  • C.V. Ciobanu, C. Predescu: Reconstruction of silicon surfaces: A stochastic optimization problem, Phys. Rev. B 70, 085321 (2004)

    Google Scholar 

  • J. Bardeen: Tunnelling from a many-particle point of view, Phys. Rev. Lett. 6, 57 (1961)

    CAS  Google Scholar 

  • R.M. Tromp, R.J. Hamers, J.E. Demuth: Scanning tunneling microscopy of Si(001), Phys. Rev. B 34, 1388 (1986)

    CAS  Google Scholar 

  • Y. Fujikawa, K. Akiyama, T. Nagao, T. Sakurai, M.G. Lagally, T. Hashimoto, Y. Morikawa, K. Terakura: Hydrogen-induced instability of the Ge(105) surface, Phys. Rev. Lett. 88, 176101 (2002)

    CAS  Google Scholar 

  • J. Klijn, L. Sacharov, C. Meyer, S. Blügel, M. Morgenstern, R. Wiesendanger: STM measurements on the InAs(110) surface directly compared with surface electronic structure calculations, Phys. Rev. B 68, 205327 (2003)

    Google Scholar 

  • F.E. Olsson, M. Persson, J. Repp, G. Meyer: Scanning tunneling microscopy and spectroscopy of NaCl overlayers on the stepped Cu(311) surface: Experimental and theoretical study, Phys. Rev. B 71, 075419 (2005)

    Google Scholar 

  • F.E. Olsson, N. Lorente, M. Persson: STM images of molecularly and atomically chemisorbed oxygen on silver, Surf. Sci. 522, L27 (2003)

    CAS  Google Scholar 

  • A. Kühnle, T.R. Linderoth, B. Hammer, F. Besenbacher: Chiral recognition in dimerization of adsorbed cysteine observed by scanning tunnelling microscopy, Nature 415, 891 (2002)

    Google Scholar 

  • J.G. Hou, Y. Jinlong, W. Haiqian, L. Qunxiang, Z. Changgan, L. Hai, B. Wang, D.M. Chen, Z. Qinshi: Identifying molecular orientation of individual C60 on aSi(111)–(\(7\times 7\)) surface, Phys. Rev. Lett. 83, 3001 (1999)

    CAS  Google Scholar 

  • J.I. Pascual, J. Gomez-Herrero, C. Rogero, A.M. Baro, D. Sanchez-Portal, E. Artacho, P. Ordejon, J.M. Soler: Seeing molecular orbitals, Chem. Phys. Lett. 321, 78 (2000)

    CAS  Google Scholar 

  • X. Lu, M. Grobis, K.H. Khoo, S.G. Louie, M.F. Crommie: Spatially mapping the spectral density of a single C60 molecule, Phys. Rev. Lett. 90, 096802 (2003)

    Google Scholar 

  • T.A. Jung, R.R. Schlittler, J.K. Gimzewski, H. Tang, C. Joachim: Controlled room-temperature positioning of individual molecules: Molecular flexure and motion, Science 271, 181 (1996)

    CAS  Google Scholar 

  • B. Bhushan (Ed.): Scanning Probe Microscopy in Nanoscience and Nanotechnology (Springer, Heidelberg 2012)

    Google Scholar 

  • M. Bowker, P.R. Davies (Eds.): Scanning Tunneling Microscopy in Surface Science, Nanoscience and Catalysis (Wiley–VCH, Weinhein 2010)

    Google Scholar 

  • C.J. Chen: Introduction to Scanning Tunneling Microscopy (Oxford Univ. Press, Oxford 2016)

    Google Scholar 

  • M. Liu: Controlled Synthesis and Scanning Tunneling Microscopy Study of Graphene and Graphene-based Heterostructures (Springer, Singapore 2018)

    Google Scholar 

  • R. Mader: Scanning Tunneling Microscopy and Spectroscopy of Aluminium-based Quasicrystals and Approximants (Logos, Berlin 2010)

    Google Scholar 

  • M. Peter: Towards Magnetic Resonance in Scanning Tunneling Microscopy Using Heterodyne Detection (KIT Scientific, Amsterdam 2015)

    Google Scholar 

  • H. Prüser: Scanning Tunneling Microscopy of Magnetic Bulk Impurities (Springer, Cham 2015)

    Google Scholar 

  • S. Sharma: Scanning Tunneling Microscopy and Atomic Force Microscopy (GRIN, Munich 2017)

    Google Scholar 

  • B. Voigtländer: Scanning Probe Microscopy, Atomic Force Microscopy and Scanning Tunneling Microscopy (Springer, Berlin 2015)

    Google Scholar 

  • M. Yamashita, H. Shigekawa, R. Morita (Eds.): Mono-Cycle Photonics and Optical Scanning Tunneling Microscopy. Route to Femtosecond Ångstrom Technology (Springer, Berlin 2005)

    Google Scholar 

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Acknowledgements

The compilation of this chapter was supported by the U.S. Department of Energy under Contract No. DE-AC02-98CH10886.

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  1. Dept. of Electrical & Computer Engineering, University of Nebraska-Lincoln, Lincoln, NE, USA

    Peter Sutter

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    Peter W. Hawkes

  2. Dept. of Physics, Arizona State University, Tempe, AZ, USA

    John C. H. Spence

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Sutter, P. (2019). Scanning Tunneling Microscopy in Surface Science. In: Hawkes, P.W., Spence, J.C.H. (eds) Springer Handbook of Microscopy. Springer Handbooks. Springer, Cham. https://doi.org/10.1007/978-3-030-00069-1_27

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