Abstract
In the transmission electron microscope, electrons are accelerated to an energy which is high enough (10 keV to 10 MeV) to ensure that they are transmitted through a thin specimen rather than being brought to rest and absorbed. We begin this introduction with a simplified account of the physical processes which occur while these “fast” electrons are passing through the specimen.
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Further Reading
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© 1986 Plenum Press, New York
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Egerton, R.F. (1986). An Introduction to Electron Energy-Loss Spectroscopy. In: Electron Energy-Loss Spectroscopy in the Electron Microscope. Springer, Boston, MA. https://doi.org/10.1007/978-1-4615-6887-2_1
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DOI: https://doi.org/10.1007/978-1-4615-6887-2_1
Publisher Name: Springer, Boston, MA
Print ISBN: 978-1-4615-6889-6
Online ISBN: 978-1-4615-6887-2
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