Abstract
This chapter presents the experimental test setups for the fully-integrated linearized CMOS RF 0.13µm bidirectional distributed amplifier. The chip measurements that are carried out include small-signal s-parameters such as gain and return loss, harmonics power measurements such as 1-dB compression, IMD (intermodulation distortion) and noise figure measurements. All RF measurements are performed with on-wafer probing.
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© 2012 Springer Science+Business Media New York
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El-Khatib, Z., MacEachern, L., Mahmoud, S.A. (2012). Linearized CMOS Distributed Bidirectional Amplifier Experimental Setups and Chip Measurement Results. In: Distributed CMOS Bidirectional Amplifiers. Analog Circuits and Signal Processing. Springer, New York, NY. https://doi.org/10.1007/978-1-4614-0272-5_7
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DOI: https://doi.org/10.1007/978-1-4614-0272-5_7
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Publisher Name: Springer, New York, NY
Print ISBN: 978-1-4614-0271-8
Online ISBN: 978-1-4614-0272-5
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