Abstract
The importance of pico-second spectroscopy in the investigation of highly excited semiconductors is pointed out with a survey of dynamical aspects of phenomena to be studied. The present status of technical aspects of pico-second spectroscopy is reviewed. Some results of pico-second experiments performed recently for CdSe are described. Finally, it is emphasized that the study of coherent interactions of highly excited states, especially of the Bose-condensed state, with radiation fields is very important.
Preview
Unable to display preview. Download preview PDF.
References
R. R. Alfano and S. L. Shapiro: Phys. Today 28 (1975) No. 7, p.30.
H. Kuroda, S. Shionoya, H. Saito, H. Masuko and K. Mogi: Opt. Commun. 12 (1974) 107; H. Saito, S. Kuribayashi and S. Shionoya: Japan. J. appl. Phys. 15 (1976) 947.
T. Kushida, Y. Tanaka, M. Ojima and Y. Nakazaki: Japan. J. appl. Phys. 14 (1975) 1097.
H. Kuroda, S. Shionoya, H. Saito and E. Hanamura: J. Phys. Soc. Japan 35 (1973) 534.
H. Kuroda and S. Shionoya: J. Phys. Soc. Japan 36 (1974) 476.
S. Shionoya: Proc. 12th Intern. Conf. Phys. Semiconductors, Stuttgart, 1974, ed. M. H. Pilkuhn (Teubner, Stuttgart, 1974) p.113.
H. Saito, A. Kuroiwa, S. Kuribayashi, Y. Aogaki and S. Shionoya: J. Luminescence 12/13 (Proc. 1975 Intern. Conf. Luminescence, Tokyo) (1976) 575.
E. Hanamura and M. Inoue: Prog. theor. Phys. Suppl. No. 57 (1975) p. 35.
E. Hanamura: Proc. 12th Intern. Conf. Phys. Semiconductors, Stuttgart, 1974, ed. M. H. Pilkuhn (Teubner, Stuttgart, 1974) p.137.
Author information
Authors and Affiliations
Rights and permissions
Copyright information
© 1976 Springer-Verlag
About this paper
Cite this paper
Shionoya, S. (1976). Pico-second spectroscopy of highly excited semiconductors. In: Physics of Highly Excited States in Solids. Lecture Notes in Physics, vol 57. Springer, Berlin, Heidelberg. https://doi.org/10.1007/3-540-07991-2_106
Download citation
DOI: https://doi.org/10.1007/3-540-07991-2_106
Published:
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-540-07991-0
Online ISBN: 978-3-540-37975-1
eBook Packages: Springer Book Archive