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References
L. Langer, V. Bayot, E. Grivei, and J.-P. Issi, Phys. Rev. Lett. 76:479 (1996).
A. Bachtold, C. Strunk, J.-P. Salvetat, L. Forró, T. Nussbaumer, and C. Schönenberger, Nature(London) 397:673 (1999).
S.J. Tans et al., Nature(London) 386:474 (1997).
M. Bockrath et al., Science 275:1922 (1997).
R. Martel, H. R. Shea, and Ph. Avouris, Nature(London) 398:299 (1999).
S.J. Tans, A.R.M. Vershueren, and C. Dekker, Nature(London) 393:49 (1998).
R. Martel, T. Schmidt, H.R. Shea, T. Hertel, and Ph. Avouris, Appl. Phys. Lett. 73:2447 (1998).
For reviews see G. Bergmann, Phys. Rep., 107:1 (1984); P. A. Lee, and T.V. Ramakrishnan, Rev. Mod. Phys. 57:287 (1985).
A.G. Aronov, Y.V. Sharvin, Rev. Mod. Phys. 59:755 (1987).
B.L. Al’tshuler, A.G. Aronov, and B.Z. Spivak, JETP Lett. 33:94 (1981).
A. Bachtold, C. Strunk, C. Shönenberger, J.-P. Salvetat, and L. Forró, Proceedings of the 12th IWEPNM AIP, New-York (1998).
B.L. Altshuler, A.G. Aronov, and D.E. Khmelnitsky, J. Phys. C 12:7367 (1982).
D. J. Thouless, Phys. Rev. Lett. 39, 1167 (1977).
B.L. Al’tshuler and A.G. Aronov, Sov. Phys. JETP 50:968 (1979).
J. Voit, Rep. Prog. Phys. 57:977 (1994).
M. Bockrath et al., Nature(London) 397:598 (1999).
G. Bergmann, Phys. Rev. Lett. 17:95 (1982).
T. Ando, T. Nakanishi, and R. Saito, J. Phys. Soc. Jpn. 67:2857 (1998).
J.A. Appelbaum, Phys. Rev. Lett. 17:91 (1966).
P.W. Anderson, Phys. Rev. Lett. 17:95 (1966).
S. Frank, P. Poucharal, Z.L. Wang, and W.A. de Heer, Science 280:1744 (1998).
For a review see, A. Christou, Electromigration and Electronic Device Degradation, Wiley, New-York (1994).
J. Hone et al., Phys. Rev. Lett. 80:1042 (1998).
M.A. Lampert, A. Many, and P. Mark, Phys. Rev. 135:A1444 (1964).
J.W.G. Wildöer, L.C. Venema, A.G. Rinzler, R.E. Smalley, and C. Dekker, Nature(London) 391:59 (1998).
N.D. Lang and Ph. Avouris, submitted to Phys. Rev. Letters.
A. De Vita, J.-C. Charlier, X. Blasé, and R. Car, Appl. Phys. A 68:283 (1999).
A. Rochefort, D.R. Salahub, and Ph. Avouris, Chem. Phys. Lett. 297:45 (1998).
A. Rochefort, Ph. Avouris, F. Lesage, and D.R. Salahub, to appear in Phys. Rev. B (1999).
C.L. Kane and E.J. Mele, Phys. Rev. Lett. 78:1932 (1997).
J.W. Mintmire and C.T. White, Carbon 33:893 (1995).
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Avouris, P., Martel, R., Ikeda, H., Hersam, M., Shea, H.R., Rochefort, A. (2002). Electrical Properties of Carbon Nanotubes: Spectroscopy Localization and Electrical Breakdown. In: Thorpe, M.F., Tománek, D., Enbody, R.J. (eds) Science and Application of Nanotubes. Fundamental Materials Research. Springer, Boston, MA. https://doi.org/10.1007/0-306-47098-5_18
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