Advanced Nanomechanical Testing

Small-scale mechanical characterization is essential for ensuring the service performance and lifetime of small components, such as thin films and coatings, electronic sensors, and MEMS. The first mechanical measurements on the submicrometer scale were enabled by the development of nanoindentation in the 1980s. JMR has long been the flagship journal for this field. In addition to countless contributed articles, previous Focus Issues published over the past two decades have disseminated the latest in method developments and trends in the field. In addition to providing a long-expected update, this Focus Issue will expand the scope of nanomechanical testing methods beyond classical nanoindentation. Recent years have seen numerous attempts to access specific materials parameters and to better account for the typical operational conditions of the sample of interest. We therefore welcome contributions related to, but not limited to, focused ion beam (FIB) enabled methods, complex loading conditions, in-situ testing, and testing in extreme environments. Application of nanomechanical testing methods to new types of materials are also encouraged. This Focus Issue is a unique opportunity to highlight and share recent significant developments and achievements with the greater nanomechanics community. Contributing papers are solicited in the following areas: • Nanoindentation, micromechanical, and nanomechanical testing • New developments, e.g., for the acquisition of the full stress-strain response • Application to new types of materials • Complex loading conditions (cyclic fatigue, fracture testing) • Extreme testing environments (high and low temperatures, irradiation, high strain rates) • In-situ testing (in scanning electron microscope, transmission electron microscope, or synchrotron)