Collection
VDAT 2022
This special issue contains a selection of research conducted as part of the 26th International Symposium on VLSI Design and Test (VDAT-2022). It aims to bring academics, researchers, startups and industrial practitioners together to exchange their ideas in the area of VLSI design, test and system design.
Editors
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Dr. Ambika Prasad Shah
Department of Electrical Engineering, Indian Institute of Technology Jammu, J&K, India. ambika.shah@iitjammu.ac.in
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Prof. Sudeb Dasgupta
Department of Electronics and Communication Engineering, Indian Institute of Technology Roorkee, Uttarakhand, India. sudeb.dasgupta@ece.iitr.ac.in
Articles (7 in this collection)
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Design of a high precision CMOS programmable gain and data rate delta sigma ADC
Authors (first, second and last of 4)
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Design of a tunable delay line with on-chip calibration to generate process-invariant PWM signal for in-memory computing
Authors (first, second and last of 4)
