Abstract
This chapter is a continuous development of the previous chapter, and we consider a more general situation when a theoretical working capacity model contains the error stipulated by the defects of physical theories used for its construction. Such a situation appears quite often in many technical devices or systems which are based on experimental data processing. In this chapter we propose a method of statistical Bayes analysis for technical devices directed to the estimation of the TTF for these devices and errors which are used in mathematical calculations. The chapter includes the problem setting, its description and the solution of the problem for the stage prior to the experimental elaboration and analysis of the system.
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© 2011 Atlantis Press
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Savchuk, V., Tsokos, C.P. (2011). Statistical Reliability Analysis Prior Bayes Estimates. In: Bayesian Theory and Methods with Applications. Atlantis Studies in Probability and Statistics, vol 1. Atlantis Press. https://doi.org/10.2991/978-94-91216-14-5_9
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DOI: https://doi.org/10.2991/978-94-91216-14-5_9
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Publisher Name: Atlantis Press
Print ISBN: 978-94-91216-13-8
Online ISBN: 978-94-91216-14-5
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