Abstract
Thin films of vanadium oxide and new, mixed V/Ce oxide thin films with 55 and 38 atom % of V were prepared on glass substrates covered with SnO2:F (K-glass) The influence of the added cerium precursors as well as the influence of the substrate material on the formation of the films were studied in order to connect their improved intercalation properties for Li ions. The structural properties and the morphologies of the films were determined with transmission electron microscopy and grazing-incidence small-angle X-ray scattering. Transmission electron microscopy revealed the crystalline structure, with the formation of V2O5 (orthorhombic structure) in all the films. The average grain radius, obtained by grazing-incidence small-angle X-ray scattering was correlated with the layer thickness.
Acknowledgements: The Ministry of Education, Science and Sport of the Republic of Slovenia, under contract number P-024512, is thanked for its support of this work, as is the Ministry of Sciences and Technology of the Republic of Croatia, under contract number 0098026.
This is a preview of subscription content, log in via an institution to check access.
Preview
Unable to display preview. Download preview PDF.
Author information
Authors and Affiliations
Corresponding author
Rights and permissions
Copyright information
© 2004 Springer-Verlag
About this paper
Cite this paper
Orel, Z.C., Kušcer, D., Kosec, M., Turković, A. (2004). The characterization of nanocrystalline V2O5 and mixed V2O5/Ce oxide. In: Surface and Colloid Science. Progress in Colloid and Polymer Science, vol 128. Springer, Berlin, Heidelberg. https://doi.org/10.1007/b97106
Download citation
DOI: https://doi.org/10.1007/b97106
Published:
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-540-21247-8
Online ISBN: 978-3-540-39980-3
eBook Packages: Springer Book Archive