Abstract
We present a new method for obtaining the scattering length density (sld) profile perpendicular to a uniform, smooth surface which is consistent with the measured reflectivity over a finite Q range. The method is applicable to a free liquid surface as well as a thin film deposited on a known substrate. As an illustration, we apply the method to obtain: degree of ordering of an intact Langmuir-Blodgett film on a silicon substrate; surface-induced layering of water and oil in bicontinuous microemulsions; and segregation of polymers near air-film and the film-substrate interfaces.
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We are grateful to Lay-Theng Lee and R. Strey for permission to show this unpublished result.
Koberstein JT, unpublished
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© 1993 Dr. Dietrich Steinkopff Verlag GmbH & Co. KG
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Chen, S.H., Zhou, X.L., Carvalho, B.L. (1993). Inverse problems in neutron and x-ray reflectivity studies. In: Laggner, P., Glatter, O. (eds) Trends in Colloid and Interface Science VII. Progress in Colloid & Polymer Science, vol 93. Steinkopff. https://doi.org/10.1007/BFb0118480
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DOI: https://doi.org/10.1007/BFb0118480
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