Submicroscopic defects in strained polyoxymethylene
Submicroscopic defects, having an ellipsoidal shape, are created in polyoxymethylene as a function of the strain, due to local yielding processes. The size distribution of the defects can be represented by an exponential electron density autocorrelation function. The average size of the defects is independent of the strain whereas the concentration of the defects increases exponentially with increasing strain. Annealing studies show that the restoring tension of the defects is determined by the free energy of the defect surfaces, the retarding tension by the value of the macroscopic yield stress. The defects can relax, if the restoring tension gets larger than the retarding tension. Correlation between defects apparently play an important role in determining macroscopic properties of the material.
KeywordsCorrelation Length Surface Free Energy Amorphous Region Defect Concentration Particle Scattering
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