Advertisement

The ordering of thin films of symmetric diblock copolymers

  • T. P. Russell
  • A. Menelle
  • S. H. Anastasiadis
  • S. K. Satija
  • C. F. Majkrzak
Chapter
Part of the Progress in Colloid & Polymer Science book series (PROGCOLLOID, volume 91)

Abstract

The ordering of thin films of symmetric diblock copolymers of polystyrene and polymethylmethacrylate has been investigated by neutron reflectivity. It is shown that the order-disorder transition temperature depends strongly on the film thickness, increasing as the film thickness decreases. The transition is shown to lose all its first-order characteristics in the thin films. For films thinner than ∼2000 Å it is not possible to obtain the copolymer flms in the disordered state at temperatures below the decomposition temperature. A transition is observed where the copolymer goes from a partially to a fully ordered state. For thick specimens, this transition corresponds to the bulk order-disorder transition temperature. However, for thinner specimens this transition temperature depends on the film thickness in a power law manner.

Key words

Block copolymer surface ordering thin films neutron reflectivity 

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

References

  1. 1.
    Leibler L (1980) Macromolecules 13:1602–1617CrossRefGoogle Scholar
  2. 2.
    Frederickson GH, Helfand EJ (1987) J Chem Phys 87:697–705CrossRefGoogle Scholar
  3. 3.
    Frederickson GH (1987) Macromolecules 20:2535–2540CrossRefGoogle Scholar
  4. 4.
    Anastasiadis SH, Russell TP, Satija SK, Majkrzak CF (1989) Phys Rev Lett 62:1852–1855CrossRefGoogle Scholar
  5. 5.
    Als-Nielsen J (1987) In; Schommers N, von Blanckenchagen P (eds) Structure and Dynamics of Surfaces II. Springer, Berlin, pp. 181–222Google Scholar
  6. 6.
    Russell TP (1990) Mat Sci Rep 5:171–282CrossRefGoogle Scholar
  7. 7.
    Menelle A, Russell TP, Anastasiadis SH, Satija SK, Majkrzak CF (1992) Phys Rev Lett 68:67–70CrossRefGoogle Scholar

Copyright information

© Dr. Dietrich Steinkopff Verlag GmbH & Co. KG 1993

Authors and Affiliations

  • T. P. Russell
    • 2
  • A. Menelle
    • 2
  • S. H. Anastasiadis
    • 2
  • S. K. Satija
    • 2
    • 1
  • C. F. Majkrzak
    • 2
    • 1
  1. 1.National Institute of Standards and TechnologyReactor Radiation DivisionGaithersburgUSA
  2. 2.IBM Research DivisionAlmaden Research CenterSan JoseUSA

Personalised recommendations