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Accurate measurement of the interface width and density profile between polymers by reflectivity techniques

  • M. Stamm
Conference paper
Part of the Progress in Colloid & Polymer Science book series (PROGCOLLOID, volume 85)

Abstract

The application of x-ray and neutron refelectometry for the determination of the interface width and density profile between polymers is described. As an example, the initial stages of interdiffusion between deuterated and protonated polystyrene and the interfacial region between the incompatible materials polystyrene/poly-para-bromostyrene are discussed. Depending on sample preparation, an accuracy in the determination of the interfacial width as low as 0.2 nm can be achieved, which is hardly met by other techniques. Also, the shape of the density profile can be obtained in favorable cases by model fits to the reflectivity curves.

Key words

Interfaces interdiffusion blends x-ray reflectivity neutron reflectivity 

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References

  1. 1.
    Jones RAL, Kramer EJ, Rafailovich MH, Sokolov J, Schwarz SA (1989) Phys Rev Lett 62:280CrossRefGoogle Scholar
  2. 2.
    Coulon G, Russell TP, Deline VR, Green PF (1989) Macromolecules 22:2581CrossRefGoogle Scholar
  3. 3.
    Chaturvedi KK, Steiner U, Zak O, Kransch G, Schatz G, Klein J (1990) Appl Phys Lett 56:628CrossRefGoogle Scholar
  4. 4.
    Klein J, Briscoe BJ (1976) Polymer 17:481CrossRefGoogle Scholar
  5. 5.
    Foster M, Stamm M, Reiter G, Hüttenbach S (1990) Vacuum 41:1441CrossRefGoogle Scholar
  6. 6.
    Toney MF, Thompson C (1990) J Chem Phys 92:3781CrossRefGoogle Scholar
  7. 7.
    Stamm M, Majkrzak CF (1987) ACS Pol. Prepr. 28(2):18Google Scholar
  8. 8.
    Fernandez ML, Higgins JS, Penfold J, Ward RO, Shackleton C, Walsh D (1988) Polymer 29:1923CrossRefGoogle Scholar
  9. 9.
    Russell TP (1990) Mater Sci Reports 5:171CrossRefGoogle Scholar
  10. 10.
    Penfold J, Thomas RK (1990) J Phys, Cond Matter 2:1369CrossRefGoogle Scholar
  11. 11.
    Stamm M, Adv Pol Sci, Vol. 100, in pressGoogle Scholar
  12. 12.
    Lekner J (1987) Theory of Reflection, Martinus Nijhoff Publ, DordrechtGoogle Scholar
  13. 13.
    Stamm M, Reiter G, Hüttenbach S (1989) Physica B 156:564CrossRefGoogle Scholar
  14. 14.
    Hüttenbach S, Stamm M, Reiter G, Foster M, Langmuir, in pressGoogle Scholar
  15. 15.
    Stamm M, Hüttenbach S, Reiter G, Springer T (1991) Europhys Lett 14:451CrossRefGoogle Scholar
  16. 16.
    Reiter G, Steiner U (1991) J de Phys II 1:659CrossRefGoogle Scholar

Copyright information

© Dr. Dietrich Steinkopff Verlag GmbH & Co. KG 1991

Authors and Affiliations

  • M. Stamm
    • 1
  1. 1.Max-Planck-Institut für PolymerforschungMainzFRG

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