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© 1999 Springer-Verlag
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Tolan, M. (1999). Statistical description of interfaces. In: X-Ray Scattering from Soft-Matter Thin Films. Springer Tracts in Modern Physics, vol 148. Springer, Berlin, Heidelberg. https://doi.org/10.1007/BFb0112839
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DOI: https://doi.org/10.1007/BFb0112839
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