Skip to main content

Scans and resolution in angular and reciprocal space

  • Part I Experimental Realization
  • Chapter
  • First Online:
  • 1138 Accesses

Part of the book series: Springer Tracts in Modern Physics ((STMP,volume 149))

This is a preview of subscription content, log in via an institution.

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

References: Part I

  1. Amptek Firm Description (Amptek Inc. Bedford, MA 01730-2204 U.S.A. 1996)

    Google Scholar 

  2. U.W. Arndt: J. Appl. Cryst. 19, 145 (1986)

    Article  Google Scholar 

  3. W.J. Bartels: J. Vac. Sci. Technol. B1, 338 (1983)

    Google Scholar 

  4. Betriebsanleitung für das PSD System PSD-50M (M.Braun GmbH, Garching 1992)

    Google Scholar 

  5. U. Bonse, G. Materlik, W. Schröder: J. Appl. Cryst. 9, 232 (1976)

    Article  Google Scholar 

  6. J.C. Borkowski, M. Kopp: Rev. Sci. Instr. 39, 1515 (1968)

    Article  ADS  Google Scholar 

  7. B. Buras, J.S. Olsen, L. Gerward: Nucl. Instr. Meth. 178, 131 (1980)

    Article  Google Scholar 

  8. P. Coppens, D. Cox, E. Vlieg, I.K. Robinson: Synchrotron Radiation Crystallography (Academic Press, New York 1992)

    Google Scholar 

  9. H. deJeu, J.D. Shindler, E.A.L. Mol: J. Appl. Phys. 29, 511 (1996)

    Google Scholar 

  10. J.W.M. DuMond: Phys. Rev. 52, 872 (1937)

    Article  ADS  Google Scholar 

  11. A.R. Faruqi, C.C. Bond: Nucl. Instr. Meth. 201, 125 (1982)

    Article  Google Scholar 

  12. R. Feidenhans'l: Surf. Sci. Rep. 10, 105 (1989)

    Article  ADS  Google Scholar 

  13. S. Flügge: Röntgenstrahlen, Handbuch der Physik, Vol. 30 (Springer, Heidelberg 1957)

    Google Scholar 

  14. M. Hart, R.D. Rodriguez: J. Appl. Cryst. 7, 123 (1978)

    Google Scholar 

  15. H. Hashizume, M. Sauvage, J.F. Petroff, P. Riglet, B. Capelle: Rapport d'activite (Lure 1978)

    Google Scholar 

  16. HASYLAB Annual Report (1996) pp. 87–113

    Google Scholar 

  17. M.J. Howes, D.V. Morgan (eds.) Charge-Coupled Devices and Systems (Wiley, New York 1979)

    Google Scholar 

  18. W. Kleber: Einführung in die Kristallographie (Verlag der Technik, Berlin 1990)

    Google Scholar 

  19. E.E. Koch: Handbook of Synchrotron Radiation (North-Holland, Amsterdam 1983)

    Google Scholar 

  20. K. Kohra, S. Kikuta: Acta Cryst. A 24, 200 (1968)

    Article  Google Scholar 

  21. C. Kunz: Synchrotron Radiation, Techniques and Application (Springer, Heidelberg 1979)

    Google Scholar 

  22. M. von Laue: Röntgenstrahlinterferenzen (Akademische Verlagsgesellschaft Geest & Portig K.-G., Leipzig 1937)

    Google Scholar 

  23. G. Margeritondo: Introduction to Synchrotron Radiation Research (Oxford University Press, Oxford 1988)

    Google Scholar 

  24. T. Matsushita, H. Hashizume: In Handbook of Synchrotron Radiation (North-Holland, Amsterdam 1983) pp. 263–314

    Google Scholar 

  25. H. Metzger, C. Luidl, U. Pietsch, U. Vierl: Nucl. Instr. Meth. A 350, 398 (1994)

    Article  ADS  Google Scholar 

  26. W. Parrish: In International Tables for Crystallography, Part C (Kluwer Academic, Bristol 1995) pp. 539–543

    Google Scholar 

  27. Z.G. Pinsker: Dynamical Scattering of X-Rays in Crystals (Springer, Heidelberg 1978)

    Google Scholar 

  28. H. Rhan, J. Peisl: Z. Phys. B: Cond. Matter. 100, 365 (1996)

    Article  Google Scholar 

  29. H. Rhan, U. Pietsch, H. Metzger, S. Rugel, J. Peisl: J. Appl. Phys. 74, 146 (1993)

    Article  ADS  Google Scholar 

  30. F. Rieutord: Acta Cryst. A 46, 526 (1990)

    Article  Google Scholar 

  31. D. Rose, U. Pietsch, U. Zeimer: J. Appl. Phys. 81, 2601 (1997)

    Article  ADS  Google Scholar 

  32. T. Salditt, T.H. Metzger, J. Peisl: J. de Physique IV, Suppl. 4, C9-171 (1994)

    Google Scholar 

  33. M. Schuster, H. Göbel: J. Phys. D: Appl. Phys. 28, A270 (1995)

    Google Scholar 

  34. M. Schuster, L. Müller, K.E. Mauser, R. Straub: Thin Solid Films 157, 325 (1988)

    Article  ADS  Google Scholar 

  35. J. Schwinger: Phys. Rev. 70, 798 (1946)

    Google Scholar 

  36. M. Sonada, M. Takano, J. Miyahara, H. Kato: Radiology 148, 833 (1983)

    Google Scholar 

  37. R. Stömmer, A.R. Martin, W. Hub, H. Göbel, U. Pietsch: Semiconductor International, May 1998

    Google Scholar 

  38. R. Stömmer, U. Pietsch: J. Phys. D: Appl. Phys. 29, 3161 (1996)

    Article  ADS  Google Scholar 

  39. J.G. Timothy, R.P. Madden: In Handbook of Synchrotron Radiation (North-Holland, Amsterdam 1983) pp. 323–325

    Google Scholar 

  40. S.K. Sinha, M. Tolan, A. Gibaud: Phys. Rev. B 57, 2740 (1998)

    Article  ADS  Google Scholar 

  41. G. Grübel, J. Als-Nielsen, A.K. Freund: J. Phys. (France) IV, Colloque 4, C9 (1994)

    Google Scholar 

  42. E.R. Wölfel: J. Appl. Cryst. 16, 341 (1983)

    Article  Google Scholar 

Download references

Rights and permissions

Reprints and permissions

Copyright information

© 1999 Springer-Verlag

About this chapter

Cite this chapter

(1999). Scans and resolution in angular and reciprocal space. In: High-Resolution X-Ray Scattering from Thin Films and Multilayers. Springer Tracts in Modern Physics, vol 149. Springer, Berlin, Heidelberg. https://doi.org/10.1007/BFb0109388

Download citation

  • DOI: https://doi.org/10.1007/BFb0109388

  • Published:

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-540-62029-7

  • Online ISBN: 978-3-540-49625-0

  • eBook Packages: Springer Book Archive

Publish with us

Policies and ethics