Boundary and interface conditions of transport equations for device simulation

  • Dietmar Schroeder
Part of the Advances in Solid State Physics book series (ASSP, volume 36)


For the simulation of semiconductor devices, models of the physical transport processes at the interfaces between different materials (semiconductors, metals, insulators) must be available. Usually, these models are formulated as boundary or interface conditions for the transport equations. In this paper, the inflow moments method is introduced, which allows to systematically derive such models from basic principles of interface electron transport. A review of a wide variety of models for semiconductor-semiconductor-, semiconductor-metal-, and semiconductor-insulator-interfaces is presented; the models are classified according to the general framework and discussed in the context of device simulation. In addition, a new model for hot electrons at an ohmic contact is included.


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Copyright information

© Friedr. Vieweg & Sohn Verlagsgesellschaft mbH 1997

Authors and Affiliations

  • Dietmar Schroeder
    • 1
  1. 1.Technical ElectronicsTU Hamburg-HarburgHamburgGermany

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