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© 1984 Springer-Verlag
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(1984). A brief background of the present requirement for structural characterization of disordered materials. In: Waseda, Y. (eds) Novel Application of Anomalous (Resonance) X-ray Scattering for Structural Characterization of Disordered Materials. Lecture Notes in Physics, vol 204. Springer, Berlin, Heidelberg. https://doi.org/10.1007/BFb0025746
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DOI: https://doi.org/10.1007/BFb0025746
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