Abstract
The conventional fluxing fundamental and flux chemistry have been discussed in Soldering Process Chapter. The critical challenges encountered during soldering process have also been reviewed in details. However, with the advancement of electronic industry, novel designs and processes emerged frequently, but criteria on the process yield or reliability of devices are either maintained or even raised. Examples include emergence of bottom-terminated-components (BTC), further advancement of miniaturization, switching from flux-residue-cleaning to no-clean process, probe testable flux residue at in-circuit-test, incorporation of VIPPO design on the board, simultaneous assembly of surface mountable components (SMC) and shield for electromagnetic insulation (EMI), replacing wave soldering with solder paste reflow for through-hole component, etc.
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References
Materials having increased mobility after heating. US Patent 10,010,981
Hance H, Lee N-C (1993) Voiding mechanisms in SMT. China Lake’s 17th Annual Electronics Manufacturing Seminar
Lee N-C (2002) Flux technology for lead-free alloys & its impact on cleaning. SMTA International, Chicago, IL, September, 2002
Lee N-C (2001) Reflow soldering processing and troubleshooting SMT, BGA, CSP, and flip chip technologies. Newnes, p 288
Liu Y, Fiacco P, Lee N-C (2010) Testing and prevention of head-in-pillow. Surface Mount Technology Association (SMTA) China South Conference at NEPCON Shenzhen, August 2010
Hu M, Kresge L, Lee N-C (2011) Epoxy flux—a low cost high reliability approach for PoP assembly. International Microelectronics Assembly and Packaging Society (IMAPS) Conference, Long Beach, CA, 9–13 October 2011
Yin W, Beckwith G, Hwang H-S, Kresge L, Lee N-C (2002) Epoxy flux—an answer for low cost no-clean flip chip assembly. Nepcon West/Fiberoptic Automation Expo, San Jose, CA, 3–6 December 2002
Yin W, Lee N-C (2003) A novel epoxy flux for lead-free soldering. International Brazing and Soldering Conference, San Diego, CA, 16–21 February 2003
Chiu T-C, Zeng K, Stierman R, Edwards D, Ano K (2004) Effect of thermal aging on board level drop reliability for Pb-free BGA packages. 54th ECTC, 1–4 June , 2004, pp 1256–1262
Farris A, Pan J, Liddicoat A, Krist M, Vickers N, Toleno BJ, Maslyk D, Shangguan D, Bath J, Willie D, Geiger DA (2009) Drop test reliability of edge-bonded lead-free chip scale packages. Flextronic Henkel, and Cal Poly State University Report, San Luis Obispo, CA
Srinivas V (2010) Reliability evaluation of one-pass and two-pass techniques of assembly for package-on-packages under torsion loads. APEX, S34_03, 6–9 April 2010
Lee N-C, Evans G (1987) Solder paste: meeting the SMT Challenge. SITE Magazine, June 1987
Hance WB, Jaeger PA, Lee N-C (1991) Solder beading in SMT—cause and cure. Proceedings of Surface Mount International, San Jose, California, August 1991, p 210
Keck J, Lee N-C (2017) Assessment of solder paste technology limitation at miniaturization for SIP and SMT application. ICEPT, Harbin, China, August 16–19 2017
Xiao M, Lawless KJ, Lee N-C (2013) Prospects of solder paste in ultra fine pitch era. SMI, September 2013, pp 454–468
Lentz T (2016) Can nano-coatings really improve stencil performance?. SMTAI
Smith G, Lentz T (2017) An investigation into the durability of stencil coating technologies. APEX, S21-02, San Diego, CA, 12–16 February 2017
Jaeger P, Lee N-C (1992) A model study of low residue no-clean solder paste. Nepcon West, Anaheim, CA
Mao R, Chen F, Lee N-C (2019) Fluxes with decreased viscosity after reflow for flip chip and SIP assembly. IMAPS, Boston, MA, 30 September–4 October 2019
Chen F, Lee N-C (2015) The risk of no-clean flux not fully dried under component terminations. SMTA China East, Shanghai, China, 20–23 April 2015
Padnos G (2010) PCB assembly system set-up for Pop. Apex, S19-03, 6–9 April 2010
Wayne Johnson R, Liu Y, Tian G, Gale S, Lall P (2003) Assembly and drop test reliability of lead free CSPs
Lee NC (2002) Reflow soldering processes and troubleshooting: SMT, BGA, CSP, and flip chip technologies. NEWNES, New York
Data sheet of Place-N-Bond Underfilm, Alltemated Inc.; www.Alltemated.com
Yin W, Beckwith G, Hwang H-S, Lee N-C (2002) Low cost no-flow underfilling being a reality for manufacturing. Nepcon West/Fiberoptic Automation Expo, San Jose, CA, 3–6 December 2002
Xiao M, Jaeger PA, Lee N-C (1997) Probe testability of no-clean solder pastes. Nepcon West
Lee N-C (2005) Critical parameters in voiding control at reflow soldering. Chip Scale Review, August–September 2005
Bastow E (2011). The effects of partially activated no-clean flux residues under component bodies and no-clean flux residues entrapped under RF cans on electrical reliability. APEX
Lee N-C (2007) Future lead-free solder alloys and fluxes—meeting challenges of miniaturization. International Microsystems, Packaging, Assembly and Circuits Technology (IMPACT) conference, Taipei, Taiwan, 1–3 October 2007
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Lau, J.H., Lee, NC. (2020). Advanced Specialty Flux Design. In: Assembly and Reliability of Lead-Free Solder Joints. Springer, Singapore. https://doi.org/10.1007/978-981-15-3920-6_4
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DOI: https://doi.org/10.1007/978-981-15-3920-6_4
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