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Lifetime Prediction Model of IGBT Modules in EMU

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Proceedings of the 4th International Conference on Electrical and Information Technologies for Rail Transportation (EITRT) 2019 (EITRT 2019)

Part of the book series: Lecture Notes in Electrical Engineering ((LNEE,volume 638))

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Abstract

The purpose of this paper is establishing the life prediction model of the IGBT modules in traction converter. Firstly, the failure mechanism of IGBTs and the existing life prediction models is described. Then, according to the special working condition of IGBTs inside TC, a bidirectional accelerated aging experiment was designed, and the experiment proved that loss on free-wheeling diode accelerated the IGBT aging. Then, the Weibull distribution was used to fit the data of accelerated aging experiment of IGBTs, and the parameters of the Weibull distribution were solved by the maximum likelihood method and particle swarm algorithm. Finally, the IGBT life prediction model is established according to the Weibull distribution obtained by this experiment.

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Acknowledgements

This work is supported by the National Key Research and Development Program of China (No. 2016YFB1200504-C-02).

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Authors and Affiliations

  1. School of Electrical Engineering, Beijing Engineering Research Center of Electric Rail Transportation, Beijing Jiaotong University, Beijing, 100044, China

    Benchao Zhu & Lei Wang

  2. CRRC Tangshan Co., Ltd., Tangshan, Hebei, China

    Lei Zhang, Ming Li & Yanqin Wang

Authors
  1. Benchao Zhu
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  2. Lei Wang
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  3. Lei Zhang
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  4. Ming Li
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  5. Yanqin Wang
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Corresponding author

Correspondence to Lei Wang .

Editor information

Editors and Affiliations

  1. State Key Laboratory of Rail Traffic Control and Safety, Beijing Jiaotong University, Beijing, China

    Limin Jia

  2. State Key Laboratory of Rail Traffic Control and Safety, Beijing Jiaotong University, Beijing, China

    Yong Qin

  3. National Innovation Center of High Speed Train, Qingdao, China

    Baoming Liu

  4. Beijing Jiaotong University, Beijing, China

    Zhigang Liu

  5. Beijing Jiaotong University, Beijing, China

    Lijun Diao

  6. School of Science, Engineering and Environment, University of Salford, Salford, UK

    Min An

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Zhu, B., Wang, L., Zhang, L., Li, M., Wang, Y. (2020). Lifetime Prediction Model of IGBT Modules in EMU. In: Jia, L., Qin, Y., Liu, B., Liu, Z., Diao, L., An, M. (eds) Proceedings of the 4th International Conference on Electrical and Information Technologies for Rail Transportation (EITRT) 2019. EITRT 2019. Lecture Notes in Electrical Engineering, vol 638. Springer, Singapore. https://doi.org/10.1007/978-981-15-2862-0_57

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  • DOI: https://doi.org/10.1007/978-981-15-2862-0_57

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  • Publisher Name: Springer, Singapore

  • Print ISBN: 978-981-15-2861-3

  • Online ISBN: 978-981-15-2862-0

  • eBook Packages: EngineeringEngineering (R0)

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