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Contact Melting in Ag/Ge Layered Nanofilms: Critical Thickness and Onset Temperature

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Microstructure and Properties of Micro- and Nanoscale Materials, Films, and Coatings (NAP 2019)

Part of the book series: Springer Proceedings in Physics ((SPPHY,volume 240))

Abstract

We present the results of a rigorous investigation of contact melting in thin Ag/Ge bilayers fulfilled via ex-situ TEM techniques based on tracing the abrupt changes of sample morphology and structure at melting. It has been revealed that the liquid-phase formation in the system at the eutectic temperature takes place only if the silver film mass thickness value is greater than the critical one (≈1.2 nm), which corresponds to ≈8 nm-sized Ag nanoparticles. The onset temperature of liquid nuclei formation at the metal-semiconductor interface was estimated to be 200 °C.

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Acknowledgements

This work was supported by the Ministry of Education and Science of Ukraine (0119U101787, 0118U002027) and the National Science Centre, Poland (project No. 2016/23/B/ST8/00537).

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Authors and Affiliations

  1. V. N. Karazin Kharkiv National University, Kharkiv, Ukraine

    Alexey Minenkov & Sergey Bogatyrenko

  2. AGH University of Science and Technology, Kraków, Poland

    Aleksandr Kryshtal

Authors
  1. Alexey Minenkov
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  2. Aleksandr Kryshtal
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  3. Sergey Bogatyrenko
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Correspondence to Alexey Minenkov .

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Editors and Affiliations

  1. Sumy State University, Sumy, Ukraine

    Alexander D. Pogrebnjak

  2. Sumy State University, Sumy, Ukraine

    Oleksandr Bondar

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Minenkov, A., Kryshtal, A., Bogatyrenko, S. (2020). Contact Melting in Ag/Ge Layered Nanofilms: Critical Thickness and Onset Temperature. In: Pogrebnjak, A., Bondar, O. (eds) Microstructure and Properties of Micro- and Nanoscale Materials, Films, and Coatings (NAP 2019). Springer Proceedings in Physics, vol 240. Springer, Singapore. https://doi.org/10.1007/978-981-15-1742-6_27

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  • DOI: https://doi.org/10.1007/978-981-15-1742-6_27

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  • Publisher Name: Springer, Singapore

  • Print ISBN: 978-981-15-1741-9

  • Online ISBN: 978-981-15-1742-6

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