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A Risk Assessment Method for IoT Systems Using Maintainability, Safety, and Security Matrixes

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Information Science and Applications

Part of the book series: Lecture Notes in Electrical Engineering ((LNEE,volume 621))

Abstract

Risk assessment for IoT systems is necessary not only for security reasons but also for safety. Accordingly, the authors have developed risk assessment methods that take into account both factors. Remote maintenance for IoT systems is becoming increasingly available. Given this development, it is important to balance maintainability with the safety and security of the target IoT system. To make this possible, we developed a method and supporting program to determine the optimal combination of suitable measures to ensure a proper balance based on quantitative analysis. In an illustrative application, we applied our method to a multi-parameter vital signs IoT monitor used in hospitals and/or care homes. It was found that the introduction of a remote maintenance capability increases total risk if measures to address information leakage are not implemented. Under constraint conditions related to the cost of such leakage prevention measures, we were able to specifically identify the optimal combination of measures that maximizes the difference between the benefit and cost of introducing remote maintenance.

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References

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Acknowledgements

This research was conducted with the support of the Ministry of Education, Culture, Sports, Science and Technology as part of a private university research branding project at Tokyo Denki University titled “Formation of a secure and advanced biomedical engineering base in the age of global IoT” [7]. We thank the project members for their helpful discussion to proceed with our research. We would also like to thank Professor Jigang Liu of Metropolitan State University for helpful comments on organizing this paper.

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Correspondence to Ryoichi Sasaki .

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Sasaki, R. (2020). A Risk Assessment Method for IoT Systems Using Maintainability, Safety, and Security Matrixes. In: Kim, K., Kim, HY. (eds) Information Science and Applications. Lecture Notes in Electrical Engineering, vol 621. Springer, Singapore. https://doi.org/10.1007/978-981-15-1465-4_37

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  • DOI: https://doi.org/10.1007/978-981-15-1465-4_37

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  • Publisher Name: Springer, Singapore

  • Print ISBN: 978-981-15-1464-7

  • Online ISBN: 978-981-15-1465-4

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