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Performance Degradation Analysis of Doppler Velocity Sensor Based on Inverse Gaussian Process and Poisson Shock

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Stochastic Models in Reliability, Network Security and System Safety (JHC80 2019)

Part of the book series: Communications in Computer and Information Science ((CCIS,volume 1102))

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Abstract

The degraded failure of on-board Doppler Velocity Sensor (DVS), which achieves non-contact velocity measurement based on Doppler principle, can be mainly attributed to the aging of microwave modules and deviation of the radar emission angle. For the microwave modules, active devices such as Gunn diodes are prior in degradation with respect to other passive devices, with the phase noise expanding monotonically. On the other hand, the emission angle of antenna deviates due to the metro vibration. In view of the actual working condition of metro, the DVS may also suffer external shocks during the natural degradation process, which is mixed with the natural degradation by model of compound Poisson process in this paper. In view of the non-reversibility of degradation, the inverse Gaussian process is chosen to describe the gradual degradation of DVS. In addition, given the inherent and postnatal differences among individual products, such as the dislocation of active devices induced during the thermos-compression bonding and individual installation error of antenna, the drift coefficients in the model are randomized. On this basis, the impact of external shock is introduced into the reliability analysis competing with the natural degradation of components. Finally, through parameters estimation of virtual degradation testing data by simulation, the methodology is demonstrated.

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References

  1. Meeker, W.Q., Escobar, L.A.: Statistical Methods for Reliability Data. Wiley, New York (1998)

    MATH  Google Scholar 

  2. Nelson, W.: Accelerated Testing: Statistical Models, Test Plans, and Data Analysis. Wiley, New York (1990)

    Book  Google Scholar 

  3. Shi, Y.: Bayesian methods for accelerated destructive degradation test planning. IEEE Trans. Reliab. 61, 245–253 (2012)

    Article  Google Scholar 

  4. Mohammadian, S.: Quantitative accelerated degradation testing: practical approaches. Reliab. Eng. Syst. 95, 149–159 (2010)

    Article  Google Scholar 

  5. Ye, Z.: Degradation-based burn-in planning under competing risks. Technometrics 54(2), 159–168 (2012)

    Article  MathSciNet  Google Scholar 

  6. Chen, Z.: Lifetime distribution based degradation analysis. IEEE Trans. Reliab. 54, 3–10 (2005)

    Article  Google Scholar 

  7. Guida, M.: The inverse gamma process: a family of continuous stochastic models for describing state-dependent deterioration phenomena. Reliab. Eng. Syst. Saf. 120, 72–79 (2013)

    Article  Google Scholar 

  8. Liao, H.: Reliability inference for field conditions from accelerated degradation testing. Nav. Res. Logist. 53, 576–587 (2006)

    Article  MathSciNet  Google Scholar 

  9. Wang, L.: A Bayesian reliability evaluation method with integrated accelerated degradation testing and field information. Reliab. Eng. Syst. Saf. 112, 38–47 (2013)

    Article  Google Scholar 

  10. Peng, Y.: Current status of machine prognostics in condition-based maintenance: a review. Int. J. Adv. Manuf. Technol. 50, 297–313 (2010)

    Article  Google Scholar 

  11. Gebraeel, N.: Residual-life distributions from component degradation signals: a Bayesian approach. IIE Trans. 37(6), 543–557 (2005)

    Article  Google Scholar 

  12. Wang, W.: A simulation-based multivariate Bayesian control chart for real time condition-based maintenance of complex systems. Eur. J. Oper. Res. 218(3), 726–734 (2012)

    Article  Google Scholar 

  13. Xu, Z.: Real-time reliability prediction for a dynamic system based on the hidden degradation process identification. IEEE Trans. Reliab. 57, 230–242 (2008)

    Article  Google Scholar 

  14. Sun, Z.: The error analysis and improving method of traffic radar speed gun. Chin. J. Sci. Instrument. 24(4), 418–420 (2003)

    Google Scholar 

  15. Sun, D.: Beam direction correction of Doppler speed radar on locomotive. Fire Control Radar Technol. 38(1), 48–51 (2009)

    Google Scholar 

  16. Lu, L.: Performance Degradation Monitoring and Speed Reading Compensation Method for On-Board Radar Speed Sensors of Trains 32(4), 93–97 (2011)

    Google Scholar 

  17. Ye, Z.: Stochastic modelling and analysis of degradation for highly reliable products. Appl. Stoch. Models Bus. Ind. 31(Special Issue), 16–32 (2015)

    Google Scholar 

  18. Ye, Z.: Degradation data analysis using Wiener processes with measurement errors. IEEE Trans. Reliab. 62(4), 772–780 (2013)

    Article  Google Scholar 

  19. Wang, X.: Wiener processes with random effects for degradation data. J. Multivar. Anal. 101, 340–351 (2010)

    Article  MathSciNet  Google Scholar 

  20. Zhang, Z.: A prognostic approach for systems subject to Wiener degradation process with cumulative-type random shocks. In: 6th Data Driven Control and Learning Systems Conference, pp. 694–698. IEEE, Chongqing, China (2017)

    Google Scholar 

  21. Peng, C.: Inverse Gaussian processes with random effects and explanatory variables for degradation data. Technometrics 57(1), 100–111 (2015)

    Article  MathSciNet  Google Scholar 

  22. Ye, Z.: The inverse Gaussian process as a degradation model. Technometrics 56(3), 302–311 (2014)

    Article  MathSciNet  Google Scholar 

  23. Wang, X.: An inverse Gaussian process model for degradation data. Technometrics 52(2), 188–197 (2010)

    Article  MathSciNet  Google Scholar 

  24. Ye, Z.: A distribution-based systems reliability model under extreme shocks and natural degradation. IEEE Trans. Reliab. 60(1), 246–256 (2011)

    Article  Google Scholar 

  25. Wang, Q.: Failure modeling and maintenance decision for GIS equipment subject to degradation and shocks. IEEE Trans. Power Delivery 32(2), 1079–1088 (2017)

    Article  Google Scholar 

  26. Si, X.: A prognostic model for degrading systems with randomly arriving shocks. In: Prognostics and System Health Management Conference, pp. 1–4. IEEE, Chengdu, China (2016)

    Google Scholar 

  27. Mauricio, J.: Optimal maintenance policy for a compound Poisson shock model. IEEE Trans. Reliab. 62(1), 66–72 (2013)

    Article  Google Scholar 

  28. Peng, W.: Inverse Gaussian process models for degradation analysis: a Bayesian perspective. Reliab. Eng. Syst. Saf. 130, 175–189 (2014)

    Article  Google Scholar 

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Acknowledgement

This paper was co-supported by the Natural Science Foundation of Beijing Municipality (L171003), National Natural Science Foundation of China (51620105010, 51575019), and Program 111 of China.

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Correspondence to Shaoping Wang .

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Geng, Y., Wang, S., Shi, J., Wang, W. (2019). Performance Degradation Analysis of Doppler Velocity Sensor Based on Inverse Gaussian Process and Poisson Shock. In: Li, QL., Wang, J., Yu, HB. (eds) Stochastic Models in Reliability, Network Security and System Safety. JHC80 2019. Communications in Computer and Information Science, vol 1102. Springer, Singapore. https://doi.org/10.1007/978-981-15-0864-6_7

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  • DOI: https://doi.org/10.1007/978-981-15-0864-6_7

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