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Assessment of Reliability in Accelerated Degradation Testing with Initial Status Incorporated

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Part of the book series: Communications in Computer and Information Science ((CCIS,volume 1102))

Abstract

Accelerated Degradation Test (ADT) provides effective information for reliability assessment of performance characteristic of long-life and high-reliability products. Existing typical models and analysis usually assume that the products under test are of high consistency level during the manufacturing process, which implies that the individual differences of the initial performance of the products can be ignored. However, this may not be the case, and the initial performance of the test units may have great impact on the subsequent degradation rate. Both positively related and negatively related are possible. This phenomenon can be observed in many different examples, such as the performance of inkjet printer heads. It means that reliability-related information can be obtained before accelerated degradation test. The study considers the impact of initial performance on the reliability assessment. Based on the existing typical accelerated degradation test model and analysis process, this paper introduces the initial information of the products to carry out reliability assessment and test plan. The asymptotic variance of a lifetime quantile at normal use conditions is considered to obtain the optimum test plan. Results show that the initial performance of the test units can be made use of to improve the accuracy of estimators. The impact of fisher information has been taken into account.

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Acknowledgements

The authors are honored to get invitation for contributing a book chapter to celebrate the 80th birthday of Professor Jinhua Cao. The authors are also thankful for the reviewers’ comments and suggestions.

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Correspondence to Qingpei Hu .

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Wang, C., Hu, Q., Yu, D. (2019). Assessment of Reliability in Accelerated Degradation Testing with Initial Status Incorporated. In: Li, QL., Wang, J., Yu, HB. (eds) Stochastic Models in Reliability, Network Security and System Safety. JHC80 2019. Communications in Computer and Information Science, vol 1102. Springer, Singapore. https://doi.org/10.1007/978-981-15-0864-6_10

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  • DOI: https://doi.org/10.1007/978-981-15-0864-6_10

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  • Publisher Name: Springer, Singapore

  • Print ISBN: 978-981-15-0863-9

  • Online ISBN: 978-981-15-0864-6

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