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Surface Monitoring

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High Definition Metrology Based Surface Quality Control and Applications

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Abstract

As an effective tool for quality control, statistical process control (SPC) has been widely used in various industries for special cause identification, removal and variation reduction (Montgomery in Introduction to statistical quality control. Wiley, 2007 [1].

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Authors and Affiliations

  1. School of Mechanical Engineering, Shanghai Jiao Tong University, Shanghai, China

    Shichang Du

  2. School of Mechanical Engineering, Shanghai Jiao Tong University, Shanghai, China

    Lifeng Xi

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  1. Shichang Du
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  2. Lifeng Xi
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Du, S., Xi, L. (2019). Surface Monitoring. In: High Definition Metrology Based Surface Quality Control and Applications. Springer, Singapore. https://doi.org/10.1007/978-981-15-0279-8_6

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