Abstract
This study is focused on identifying and recognizing the failures associated with analog alarm trip units (ATUs). Electronic components of ATU were identified and simulation was carried out to study the effects of component failures. Different modes of failure of each electronic component were considered. Component failures leading to safe and unsafe states of ATU were found out and documented. This study would help to identify unsafe failure modes of ATU and their effect on plant safety.
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References
User manual of Current/Voltage Trip Amplifier, Reputed make
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Dutta, S., Wankhede, S.B., Gadgil, K.V., Panyam, S. (2020). Failure Mode Effect Analysis of Analog Alarm Trip Unit Using Simulation Technique. In: Varde, P., Prakash, R., Vinod, G. (eds) Reliability, Safety and Hazard Assessment for Risk-Based Technologies. Lecture Notes in Mechanical Engineering. Springer, Singapore. https://doi.org/10.1007/978-981-13-9008-1_16
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DOI: https://doi.org/10.1007/978-981-13-9008-1_16
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Publisher Name: Springer, Singapore
Print ISBN: 978-981-13-9007-4
Online ISBN: 978-981-13-9008-1
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