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Transactions on Intelligent Welding Manufacturing pp 75–92Cite as

Development of a Low-Cost Arc Spectrum Sensor for Monitoring Pore Defects in Welding Process

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Part of the book series: Transactions on Intelligent Welding Manufacturing ((TRINWM))

Abstract

Commercial spectrometers commonly used in the market have the advantages of high resolution, small size, strong portability and high sensitivity. However, the commercial spectrometers are often unable to meet the needs of spectral information analysis in specific welding scenarios due to the lack of sufficient pertinence in the analysis of arc spectral information. Especially commercial spectrometers are generally expensive, and the software interface is not open, which means that we will not be able to real-time analyze and process the data obtained by spectrometers. Based on this, a low-cost arc spectrum information sensor based on Cherney-Turner optical system is designed and manufactured to detect the formation of hydrogen pore defects in welding process, and to provide support for the follow-up research on hydrogen pore defects. Specifically, we can effectively detect hydrogen content in arc atmosphere by monitoring the spectral intensity of hydrogen atom in arc light during welding process and detect hydrogen pore in molten pool. Experiments show that the sensor achieves real-time and effective detection and acquisition of arc spectrum information in aluminum alloy welding process.

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Acknowledgements

This work is supported by the National Natural Science Foundation of China (51575349).

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Authors and Affiliations

  1. Intelligentized Robotic Welding Technology Laboratory, School of Materials Science and Engineering, Shanghai Jiao Tong University, 200240, Shanghai, China

    Gang Li, Haiping Chen, Jingyuan Xu, Chao Chen, Na Lv & Shanben Chen

Authors
  1. Gang Li
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  2. Haiping Chen
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  3. Jingyuan Xu
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  4. Chao Chen
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  5. Na Lv
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  6. Shanben Chen
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Corresponding authors

Correspondence to Na Lv or Shanben Chen .

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Editors and Affiliations

  1. Shanghai Jiaotong University , Shanghai, Shanghai, China

    Shanben Chen

  2. Depart. of Electrical and Comp. Eng., University of Kentucky Depart. of Electrical and Comp. Eng., Lexington, KY, USA

    Yuming Zhang

  3. Oak Ridge National Laboratory, Oak Ridge, USA

    Zhili Feng

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Li, G., Chen, H., Xu, J., Chen, C., Lv, N., Chen, S. (2019). Development of a Low-Cost Arc Spectrum Sensor for Monitoring Pore Defects in Welding Process. In: Chen, S., Zhang, Y., Feng, Z. (eds) Transactions on Intelligent Welding Manufacturing. Transactions on Intelligent Welding Manufacturing. Springer, Singapore. https://doi.org/10.1007/978-981-13-8668-8_4

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