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Intelligent Communication, Control and Devices pp 321–324Cite as

Image Analysis of SEM Micrograph of Co-doped ZnO-Based Oxide Semiconductors

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Part of the book series: Advances in Intelligent Systems and Computing ((AISC,volume 989))

Abstract

Digital image processing deals with the processing of digital images using its standard methods like restoration, noise reduction, segmentation and edge detection. The proposed work represents a novel image processing technique access and validates the findings of scanning electron microscopy micrographs of Co-doped ZnO dilute magnetic semiconductors. Median and Sobel filtering techniques are used to improve the quality of the image whereas the watershed segmentation algorithm is used to determine to approximate particle size as well as distribution.

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Author information

Authors and Affiliations

  1. The ICFAI University, Jaipur, India

    Rana Mukherji & Vishal Mathur

  2. Amity University Jaipur, Jaipur, Rajasthan, India

    Manishita Mukherji

Authors
  1. Rana Mukherji
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  2. Vishal Mathur
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  3. Manishita Mukherji
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Corresponding author

Correspondence to Rana Mukherji .

Editor information

Editors and Affiliations

  1. Department of Electronics, University of Petroleum and Energy Studies, Dehradun, Uttarakhand, India

    Sushabhan Choudhury

  2. Department of Electronics, University of Petroleum and Energy Studies, Dehradun, Uttarakhand, India

    Ranjan Mishra

  3. Department of Electronics, University of Petroleum and Energy Studies, Dehradun, Uttarakhand, India

    Raj Gaurav Mishra

  4. Department of Electronics, University of Petroleum and Energy Studies, Dehradun, Uttarakhand, India

    Adesh Kumar

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Cite this paper

Mukherji, R., Mathur, V., Mukherji, M. (2020). Image Analysis of SEM Micrograph of Co-doped ZnO-Based Oxide Semiconductors. In: Choudhury, S., Mishra, R., Mishra, R., Kumar, A. (eds) Intelligent Communication, Control and Devices. Advances in Intelligent Systems and Computing, vol 989. Springer, Singapore. https://doi.org/10.1007/978-981-13-8618-3_34

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