Abstract
The increasing variety and quantity of power modules for aerospace causes difficulty and complication for their testing. This paper studies the testing technology, develop the testing software and design with hardware universal interface to realize an automatic testing technology with data collection and interpretation, waveform automatic storage, command automatic switch, output channel automatic switch. The technology not only increases the testing efficacy by more than 100%, but also the risk factors caused by manual operation during the test are eliminated and the reliability and safety of the test system are improved. The technology is suitable for testing all current power modules.
This is a preview of subscription content, log in via an institution.
Buying options
Tax calculation will be finalised at checkout
Purchases are for personal use only
Learn about institutional subscriptionsReferences
Beshr, H.M., et al.: Modelling of a residential solar standalone power system. In: Proceeding of the 1st International Nuclear and Renewable Energy Conference (2010)
Bhandari, R., Stadler, I.: Electrification using solar photovoltaic systems in Nepal. Appl. Energy J. 88, 458–465 (2011)
Dambrine, G., Cappy, A., Heliodore, F., Playez, E.: A new method for determining the FET small-signal equivalent circuit. IEEE Trans. Microw. Theory Tech. 36(7), 1151–1159 (1988)
Gu, W.B., Wang, C.Y., Liaw, B.Y.: Numerical modeling of coupled electrochemical and transport processes in lead-acid batteries. J. Electrochem. Soc. 144(6), 2053–2061 (1997)
Vandersmissen, R., Ruythooren, W., Das, J., Germain, M., Xiao, D., Schreurs, D.: Transfer from MHEMT to GaN HEMT technology: Devices and integration. In: Int. Compound Semicond. Manuf. Technol. Conf., pp. 237–240, April 2005
Lee, J.-H., Yoon, H.-S., Park, C.-S., Park, H.-M.: Ultra low noise characteristics of AlGaAs/InGaAs/GaAs pseudomorphic HEMT’s with wide head T-Shaped gate. IEEE Electron Device Lett. 16(6), 271–273 (1995)
Liu, W.: “FET high-frequency properties” in Fundamentals of III-V Devices: HBTs MESFETS and HFETs/HEMTs, pp. 422–429. Wiley, New York (1999)
Author information
Authors and Affiliations
Corresponding author
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 2019 Springer Nature Singapore Pte Ltd.
About this paper
Cite this paper
Li, H., Chen, Q., Li, Y., Cao, C. (2019). Research and Implementation of Automatic Test Technology for Power Modules in Aerospace. In: Sun, S., Fu, M., Xu, L. (eds) Signal and Information Processing, Networking and Computers. ICSINC 2018. Lecture Notes in Electrical Engineering, vol 550. Springer, Singapore. https://doi.org/10.1007/978-981-13-7123-3_17
Download citation
DOI: https://doi.org/10.1007/978-981-13-7123-3_17
Published:
Publisher Name: Springer, Singapore
Print ISBN: 978-981-13-7122-6
Online ISBN: 978-981-13-7123-3
eBook Packages: EngineeringEngineering (R0)