Improving Diagnostic Test Coverage from Detection Test Set for Logic Circuits

  • Bommidi Madhan
  • J. P. AnitaEmail author
Conference paper
Part of the Advances in Intelligent Systems and Computing book series (AISC, volume 898)


The proposed work aims at generating a diagnostic test set which is a compact test set derived from a large set of test vectors generated from any automatic test pattern generator (ATPG). This diagnostic test set is required to find out the exact location of the faults. The patterns generated from the ATPG may be sufficient to find out whether the circuit is fault free or not, but will not give the location of the fault. Hence, the proposed method aims at identifying the exact location of the faults. The experiment has been carried out on several ISCAS’85 and ISCAS’89 benchmark circuits.


Fault location Fault diagnosis Test coverage Test set 


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Copyright information

© Springer Nature Singapore Pte Ltd. 2019

Authors and Affiliations

  1. 1.Department of Electronics and Communication Engineering, Amrita School of EngineeringAmrita Vishwa VidyapeethamCoimbatoreIndia

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