Skip to main content

Micromachined Vibrating-Reed Electrometer in Silicon-on-Glass Technology

  • Chapter
  • First Online:
Micro and Nano Machined Electrometers
  • 514 Accesses

Abstract

Designing charge sensors for electrometry is deemed significant because of the sensitivity and resolution issues in the range of micro-scales. This chapter presents the design of microelectromechanical systems (MEMS) vibrating-reed (VR) electrometer developed based on micromechanical variable capacitors in silicon-on-glass (SOG) process. By using vibrating-reed technique, the resonator is driven at the frequency above the corner frequency of Flicker noise and the charge measurement is performed at the second harmonic of the resonator’s frequency. This chapter also describes the noise characterization and the referred-to-input (RTI) noise reduction methods for operational amplifier (opamp) based preamplifier. The design of an improved noninverting topology overcame the issues of leakage current and charge resetting during measurement. A comprehensive noise model has been proposed considering all electronic noise contributors including the preamp in conjunction with capacitive MEMS sensor in silicon-on glass (SOG) process and ancillary components. The research findings proved that the blocking capacitor and shunt resistor have significant impact on the RTI noise of the preamp and the charge resolution of the electrometer. The noise analysis and measurement results provide a practical guideline for low noise electrometer interface circuit design. Trade-offs among opamp selection, blocking capacitor value, shunt resistor value etc. have been discussed to provide an original and in-depth analysis for noise and resolution performance optimization in the design of MEMS electrometers.

This is a preview of subscription content, log in via an institution to check access.

Access this chapter

eBook
USD 16.99
Price excludes VAT (USA)
  • Available as EPUB and PDF
  • Read on any device
  • Instant download
  • Own it forever
Hardcover Book
USD 109.99
Price excludes VAT (USA)
  • Durable hardcover edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Purchases are for personal use only

Institutional subscriptions

References

  1. J. Jalil, Y. Zhu, C. Ekanayake, Y. Ruan, Sensing of single electrons using micro and nano technologies: a review. Nanotechnology 28, 142002 (2017)

    Article  Google Scholar 

  2. I. Ahmed, J.A. Haigh, S. Schaal, S. Barraud, Y. Zhu, C.M. Lee, M. Amado, J.W.A. Robinson, A. Rossi, J.J.L. Morton, M.F. Gonzalez-Zalba, Radio-frequency capacitive gate-based sensing. Phys. Rev. Appl. 10, 014018 (2018)

    Article  Google Scholar 

  3. R.J. Schoelkopf, P. Wahlgren, A.A. Kozhevnikov, P. Delsing, D.E. Prober, The radio-frequency single-electron transistor (RF-SET): a fast and ultrasensitive electrometer. Science 280, 1238–1242 (1998)

    Article  Google Scholar 

  4. A.N. Cleland, M.L. Roukes, A nanometer-scale mechanical electrometer. Nature 392, 160–162 (1998)

    Article  Google Scholar 

  5. J.E.Y. Lee, B. Bahreyni, A.A. Seshia, An axial strain modulated double-ended tuning fork electrometer. Sens. Actuator A Phys. 148, 395–400 (2008)

    Article  Google Scholar 

  6. D. Chen, J. Zhao, Y. Wang, Z. Xu, J. Xie, An electrostatic charge sensor based on micro resonator with sensing scheme of effective stiffness perturbation. J. Micromech. Microeng. 27, 065002 (2017)

    Article  Google Scholar 

  7. P.S. Riehl, K.L. Scott, R.S. Muller, R.T. Howe, J.A. Yasaitis, Electrostatic charge and field sensors based on micromechanical resonators. J. Microelectromech. Syst. 12, 577–589 (2003)

    Article  Google Scholar 

  8. Y. Zhu, J. Lee, A. Seshia, System-level simulation of a micromachined electrometer using a time-domain variable capacitor circuit model. J. Micromech. Microeng. 17, 1059–1065 (2007)

    Article  Google Scholar 

  9. Y. Zhu, J. Lee, A. Seshia, MEMS electrometer system simulation using a time-domain variable capacitor model, in TRANSDUCERS 2007–2007 International Solid-State Sensors, Actuators and Microsystems Conference, Lyon, 2007, pp. 1685–1688

    Google Scholar 

  10. J. Jalil, Y. Ruan, H.Z. Li, Y. Zhu, Comprehensive design considerations and noise modeling of preamplifier for MEMS electrometry. IEEE Trans. Instrum. Meas. (2019). https://doi.org/10.1109/tim.2019.2930440

  11. S.M. Sze, K.K. Ng, Physics of Semiconductor Devices (Wiley, New Jersey, 2007)

    Google Scholar 

  12. J. Lee, Y. Zhu, A. Seshia, Room temperature electrometry with SUB10 electron charge resolution. J. Micromech. Microeng. 18, 025033 (2008)

    Google Scholar 

  13. J.E. Lee, Y. Zhu, A.A. Seshia, A micromechanical electrometer approaching single-electron charge resolution at room temperature, in 2008 IEEE 21st International Conference on Micro Electro Mechanical Systems, Wuhan, 2008, pp. 948–951

    Google Scholar 

  14. Y. Zhu, J.E.Y. Lee, A.A. Seshia, A resonant micromachined electrostatic sensor. IEEE Sens. J. 8, 1499–1505 (2008)

    Google Scholar 

  15. G. Jaramillo, C. Buffa, M. Li, F.J. Brechtel, G. Langfelder, D.A. Horsley, MEMS electrometer with femtoampere resolution for aerosol particulate measurements. IEEE Sens. J. 13, 2993–3000 (2013)

    Article  Google Scholar 

  16. J. Wang, Z. Yang, G. Yan, A silicon-on-glass Z-axis accelerometer with vertical sensing comb capacitors, in Proceedings of IEEE 7th International Conference on Nano/Micro Engineered and Molecular Systems (NEMS), Kyoto, May 2012, pp. 583–586

    Google Scholar 

  17. Z. Ma, Y. Wang, Q. Shen, H. Zhang, X. Guo, Key processes of silicon-on-glass MEMS fabrication technology for gyroscope application. Sensors 18, 1240 (2018)

    Article  Google Scholar 

  18. C. Lin, C. Hsu, H. Yang, W.C. Wang, W. Fang, Implementation of silicon-on-glass MEMS devices with embedded through-wafer silicon vias using the glass reflow process for wafer-level packaging and 3D chip integration. J. Micromech. Microeng. 18, 025018 (2008)

    Article  Google Scholar 

  19. J. Jalil, Y. Ruan, Y. Zhu, Room-temperature sensing of single electrons using vibrating-reed electrometer in silicon-on-glass technology. IEEE Electron Device Lett. 39(12), 1928–1931 (2018)

    Article  Google Scholar 

  20. C.D. Motchenbacher, J.A. Connely, Low Noise Electronic System Design (Wiley, New York, 1993)

    Google Scholar 

  21. E. Serrano-Finetti, R. Pallas-Areny, Noise reduction in AC-coupled amplifiers. IEEE Trans. Instrum. Meas. 63(7), 1834–1841 (2014)

    Article  Google Scholar 

  22. Analog Devices, Inc. Datasheet AD8067 [Online]. Available: http://www.analog.com/media/en/technical-documentation/datasheets/AD8067.pdf. Accessed 1 Apr 2017

Download references

Author information

Authors and Affiliations

Authors

Corresponding author

Correspondence to Yong Zhu .

Editor information

Editors and Affiliations

Rights and permissions

Reprints and permissions

Copyright information

© 2020 Springer Nature Singapore Pte Ltd.

About this chapter

Check for updates. Verify currency and authenticity via CrossMark

Cite this chapter

Ruan, Y., Jalil, J., Zhu, Y. (2020). Micromachined Vibrating-Reed Electrometer in Silicon-on-Glass Technology. In: Zhu, Y. (eds) Micro and Nano Machined Electrometers. Springer, Singapore. https://doi.org/10.1007/978-981-13-3247-0_5

Download citation

  • DOI: https://doi.org/10.1007/978-981-13-3247-0_5

  • Published:

  • Publisher Name: Springer, Singapore

  • Print ISBN: 978-981-13-3246-3

  • Online ISBN: 978-981-13-3247-0

  • eBook Packages: EngineeringEngineering (R0)

Publish with us

Policies and ethics