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Atomic Force Microscopic Characterization of Wire Electrical Discharge Machined Samples

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Innovation in Materials Science and Engineering

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Abstract

Atomic force microscopy (AFM) is a kind of scanning probe microscopy which results in precise and accurate 2D and 3D images for examining surface topography and morphology in quantitative and qualitative terms. The main objective of this research is to characterize the surface integrity of machined samples by employing atomic force microscopy (AFM). The secondary aim is to accomplish statistical analysis of surface roughness based on different sets of machining parameters. In the current research, Taguchi’s L16 orthogonal arrays are adopted, and sixteen numbers of Ti6Al4V samples have been produced by utilizing the wire electrical discharge machining (WEDM). A comparison has also been made by probing the surface topographies, cross-sectional profiles, and roughness graphs to confirm the influence of machining parameters on the surface quality of machined samples. Through statistical analysis, the cutting voltage is found the most significant machining variable which influences the response variable.

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Abbreviations

EDM:

Electrical discharge machining

S a :

Surface roughness

ANOVA:

Analysis of variance

SS:

Sums of squares

MS:

Mean of square

F :

Fisher’s ratio

DF:

Degree of freedom

AFM:

Atomic force microscope

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Author information

Authors and Affiliations

  1. Department of Manufacturing Engineering, NIT Jamshedpur, NIT Campus, Adityapur, 831014, Jharkhand, India

    Hulas Raj Tonday & Anand Mukut Tigga

  2. Department of Mechanical Engineering, AMITY University, Ranchi, India

    Pravin Kumar Singh

Authors
  1. Hulas Raj Tonday
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  2. Pravin Kumar Singh
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  3. Anand Mukut Tigga
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Corresponding author

Correspondence to Hulas Raj Tonday .

Editor information

Editors and Affiliations

  1. Department of Chemistry, Amity University, Ranchi, Jharkhand, India

    Jayeeta Chattopadhyay

  2. Department of Mechanical Engineering, Amity University, Ranchi, Jharkhand, India

    Rahul Singh

  3. Department of Mechanical Engineering, National Institute of Technology, Patna, Patna, Bihar, India

    Om Prakash

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Tonday, H.R., Singh, P.K., Tigga, A.M. (2019). Atomic Force Microscopic Characterization of Wire Electrical Discharge Machined Samples. In: Chattopadhyay, J., Singh, R., Prakash, O. (eds) Innovation in Materials Science and Engineering. Springer, Singapore. https://doi.org/10.1007/978-981-13-2944-9_17

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  • DOI: https://doi.org/10.1007/978-981-13-2944-9_17

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  • Publisher Name: Springer, Singapore

  • Print ISBN: 978-981-13-2943-2

  • Online ISBN: 978-981-13-2944-9

  • eBook Packages: EngineeringEngineering (R0)

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