Research on Intermittent Failure Mechanism of the Electrical Connector of the Missile Launch Vehicle

  • Guanqian DengEmail author
  • Guiyou Hao
  • Yingjie Lv
  • Ying Zhou
Conference paper
Part of the Lecture Notes in Electrical Engineering book series (LNEE, volume 527)


Electrical connector has become an indispensable and important part in aviation, aerospace, and other fields, and its work is normal or not will directly affect the daily use of equipment and the success or failure of the mission. In this paper, aiming the problem of intermittent fault of electrical connector caused by poor contact. Based on the analysis of the failure causes, the test scheme of intermittent failure incentive of the electrical connector is established. The step vibration stress, rapid temperature variation plus vibration stress, high temperature plus vibration stress test were carried out in the system of test and contact resistance monitoring. And the failure mechanism analysis was carried out. The results show that the electrical connector has intermittent failure under the combined action of high temperature and vibration stress. Vibration stress will make the contact of electrical connector fretting wear, resulting in coating surface wear, peeling, and produce plastic debris. The high temperature will not only oxidize the contact surface, but also strengthen the above wear. Contact resistance changes due to contact oxidation, insulating dust, plastic debris, and so on, resulting in intermittent faults such as poor contact. The research results will provide technical support for intermittent failure prevention, fault handling, and improved design of electrical connectors.


Missile launcher Electrical connector Intermittent failure Failure mechanism 


  1. 1.
    Fang J (2007) Research on the reliability assessment and growth of integrated stress of aerospace electrical connector [D]. Zhejiang University, HangzhouGoogle Scholar
  2. 2.
    Chen X (2005) Discussion on reliability design of electrical connector [J]. Electromech Compon 1(2):18–21Google Scholar
  3. 3.
    Pan J (2007) Review on reliability research of electrical connectors [C]. In: 2007 proceedings of the national symposium on mechanical reliabilityGoogle Scholar
  4. 4.
    Lei Y (2015) Study on the operational reliability process of aerospace electrical connectors [J]. Qual Reliab 4(1):9–12Google Scholar
  5. 5.
    Contant O, Lafortune S, Teneketzis D (2004) Diagnosis of intermittent failures [J]. Discret Event Dyn Syst Theory Appl 14(2):171–202CrossRefGoogle Scholar
  6. 6.
    Zhang G, Kwan C, Xu R et al (2007) An enhanced prognostic model for intermittent failures in digital electronics [C]. In: IEEE aerospace conference, Big Sky, MT, pp 1–8Google Scholar
  7. 7.
    Rashid L, Pattabiraman K, Gopalakrishnan S (2010) Towards understanding the effects of intermittent hardware faults on programs [C]. In: International conference on dependable systems and network workshops, Chicago, IL, USA, pp 101–106Google Scholar
  8. 8.
    Deng G, Qiu J, Liu G, Lv K (2014) A stochastic automaton approach to discriminate intermittent from permanent faults. J Aerosp Eng 228(6):880–888. Scholar

Copyright information

© Springer Nature Singapore Pte Ltd. 2019

Authors and Affiliations

  • Guanqian Deng
    • 1
    Email author
  • Guiyou Hao
    • 1
  • Yingjie Lv
    • 1
  • Ying Zhou
    • 1
  1. 1.Institute of Reliability Engineering, Beijing University of Aeronautics and AstronauticsBeijingChina

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