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Distance Overestimation Error Correction Method (DOEC) of Time of Flight Camera Based on Pinhole Model

  • Le Wang
  • Minrui Fei
  • Hakuan WangEmail author
  • Zexue Ji
  • Aolei Yang
Conference paper
Part of the Communications in Computer and Information Science book series (CCIS, volume 924)

Abstract

Depth cameras with Time of Flight (ToF) technology are widely used in machine vision and various measurement tasks. However, due to hardware conditions and imaging characteristics, multiple errors limit the further application of the ToF camera. This paper classified errors into errors caused by non-imaging principle and error caused by imaging principle. In order to simplify the experimental procedure and improve the efficiency of errors correction, a simple and feasible method is used to correct errors caused by non-imaging principle, and an evaluation function is proposed to determine the optimal reference distance, so as to select appropriate integration time and global offsets. To tackle the radial distance error, Distance Overestimation Error Correction method (DOEC) based on the principle of pinhole imaging is proposed to further improve the accuracy of depth data. Finally, error correction methods proposed in this paper are verified by experiments, and the segmentation of different depth ranges is successfully achieved by using the modified data, prove the effectiveness of the proposed methods.

Keywords

Time of flight Error correction Pinhole imaging Plan segmentation Data accuracy 

Notes

Acknowledgement

This work is supported by National Science Foundation of China (61473182, 61773253), Science and Technology Commission of Shanghai Municipality (15JC1401900), Natural Science Foundation of Shanghai (No. 18ZR1415100).

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Copyright information

© Springer Nature Singapore Pte Ltd. 2018

Authors and Affiliations

  • Le Wang
    • 1
  • Minrui Fei
    • 1
  • Hakuan Wang
    • 1
    Email author
  • Zexue Ji
    • 1
  • Aolei Yang
    • 1
  1. 1.Shanghai Key Laboratory of Power Station Automation Technology, School of Mechatronic Engineering and AutomationShanghai UniversityShanghaiChina

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