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A Correlated Study of Nanotube/Nanowire Transistor Between TEM Inspection and Electrical Characterization

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Nanowire Electronics

Part of the book series: Nanostructure Science and Technology ((NST))

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Abstract

In this chapter, we introduce a novel method for a correlated study of nanowire/nanotube based on electrical measurements and electron microscope imaging. Two kinds of chip platforms are used, which named as the through-hole chip and the membrane chip, respectively. These kinds of chip platforms allow a physical correlation to be established for transmission electron microscopy inspection and electrical characterization. In order to demonstrate the correlated study, we conduct a few nanomaterials, including carbon nanotube, nanowire, and graphene derivatives, which are placed on top of the specific chips by manipulators. The results strongly indicate that the electrical property in the quasi-one-dimensional nanomaterials is sensitive to their structure such defect, contamination, and adsorption from environment.

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Authors and Affiliations

  1. Department of Physics, National Taiwan Normal University, Taipei, Taiwan

    Yann-Wen Lan & Po-Chun Chen

Authors
  1. Yann-Wen Lan
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  2. Po-Chun Chen
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Corresponding author

Correspondence to Yann-Wen Lan .

Editor information

Editors and Affiliations

  1. Institute of Semiconductors Chinese Academy of Sciences, Beijing, China

    Guozhen Shen

  2. Department of Materials Science and Engineering, National Tsing-Hua University, Taiwan, China

    Yu-Lun Chueh

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© 2019 Springer Nature Singapore Pte Ltd.

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Lan, YW., Chen, PC. (2019). A Correlated Study of Nanotube/Nanowire Transistor Between TEM Inspection and Electrical Characterization. In: Shen, G., Chueh, YL. (eds) Nanowire Electronics. Nanostructure Science and Technology. Springer, Singapore. https://doi.org/10.1007/978-981-13-2367-6_2

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