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Simulation Study of DSP’s Total Dose Resistance Circuit Based on Step by Step Analysis Method

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Part of the book series: Lecture Notes in Electrical Engineering ((LNEE,volume 494))

Abstract

The digital signal processor (DSP) is mainly found in the electronic systems of spacecraft, which is very important as a controller and calculator in satellite optical communication. The space radiation environment can cause the function degradation, parameter drift and even device failure of DSP devices, so we studied the effect of total radiation dose on DSP. We establish the model of parasitic body tube by the radiation theory and the theory of superposition of the unit parasitic transistor to obtain the total dose effect model of the n-channel MOSFET and simulate the total radiation dose effect on typical commercial type of the DSP, the total failure dose node of this commercial DSP is obtained using this method. Further on, the method established in this paper is also applicable to obtain the total radiation dose effect on other type DSP. The total radiation dose effect data of DSP is obtained by simulation can be greatly reduced for spacecraft design.

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Correspondence to Lijia Fan .

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Fan, L., Li, X., Zhang, X. (2019). Simulation Study of DSP’s Total Dose Resistance Circuit Based on Step by Step Analysis Method. In: Sun, S. (eds) Signal and Information Processing, Networking and Computers. ICSINC 2018. Lecture Notes in Electrical Engineering, vol 494. Springer, Singapore. https://doi.org/10.1007/978-981-13-1733-0_21

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  • DOI: https://doi.org/10.1007/978-981-13-1733-0_21

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  • Publisher Name: Springer, Singapore

  • Print ISBN: 978-981-13-1732-3

  • Online ISBN: 978-981-13-1733-0

  • eBook Packages: EngineeringEngineering (R0)

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