Abstract
Since “seeing is believing”, scanning probe microscopy (SPM), in terms of scanning tunneling microscopy (SPM) and atomic force microscopy (AFM), are proven to be one of the most versatile and important tools in the surface science research field, which own the ability of real space imaging with sub-Ångström resolution. In this chapter, I will give a detailed introduction of STM and non-contact atomic force microscopy (nc-AFM), focusing on the work principle, imaging, spectroscopic capabilities and applications in surface science.
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Guo, J. (2018). Scanning Probe Microscopy. In: High Resolution Imaging, Spectroscopy and Nuclear Quantum Effects of Interfacial Water. Springer Theses. Springer, Singapore. https://doi.org/10.1007/978-981-13-1663-0_2
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DOI: https://doi.org/10.1007/978-981-13-1663-0_2
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