Abstract
Clearly understanding the working principles of different modes of atomic force microscopy (AFM) is important for users to choose suitable measurement modes for their research projects, optimize working parameters, identify artifacts, and interpret data. In this chapter, conventional imaging modes and force modes will be discussed first, followed by the introduction of recent developments in AFM quantitative nano-mechanical properties measurement.
Since it was invented three decades ago (Binnig G, Quate CF, Gerber C, Phys Rev Lett 56:930–933, 1986), AFM has been becoming a more and more important instrument in nano science and technology. The uniqueness of AFM is its capability of providing nanometer spatial resolution in three dimensions while no vacuum or contrast reagent is needed. AFM has been extensively used in virtually every branch of science and engineering and contributes to many discoveries in nanomaterials, such as the discovery of graphene. In recent years, AFM has been further developed in three aspects. 1. conveying more material related information, such as mechanical, electrical, magnetic and thermal properties at nanometer scale; 2. integrating with different advanced optical techniques, including Raman, fluorescence, infrared spectroscopy; 3. incorporating with environment control for life science and material researches, such as temperature, liquid environment with pH and other ion strength control, light illumination. With these developments, AFM has been extending it applications beyond topographic imaging, such as polymer phase transition under different temperature, I-V characteristics in today’s semiconductor devices, live cell dynamics under different chemical/mechanical stimuli, molecular dynamics under different temperature and chemical environments.
On the other hand, the expanded capabilities of AFM make it difficult for users to choose a proper measurement mode, suitable probes and optimize operation parameters. Many efforts have been made to develop different smart scan modes, including peak force tapping developed by Bruker, where software can tune operation parameters to achieve optimized image quality. However, it is still users’ task to choose measurement modes, identify artifacts, interpret data for their research projects. All these need users to clearly understand the working principles of different modes. In this chapter, conventional imaging modes and force modes will be discussed first, followed by the introduction of recent developments in AFM quantitative nano-mechanical properties measurement.
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Sun, W. (2018). Principles of Atomic Force Microscopy. In: Cai, J. (eds) Atomic Force Microscopy in Molecular and Cell Biology. Springer, Singapore. https://doi.org/10.1007/978-981-13-1510-7_1
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DOI: https://doi.org/10.1007/978-981-13-1510-7_1
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