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Progress in Nanoscale Characterization and Manipulation pp 205–254Cite as

Scanning Transmission Electron Microscopy (STEM)

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Part of the book series: Springer Tracts in Modern Physics ((STMP,volume 272))

Abstract

Although Baron Manfred von Ardenne (ZPhys 109:553–572, 1938a, Z Tech Phys 19:407–416, 1938b) developed the first scanning transmission electron microscopy (STEM) in 1938, placing the image lens before the specimen instead of after the specimen as in the Ruska TEM design, it is just a sound idea in principle: he did not use a field emission source such that the 10 nm resolution images he achieved were too noisy.

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Author information

Authors and Affiliations

  1. Beijing, China

    Binghui Ge

Authors
  1. Binghui Ge
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Correspondence to Binghui Ge .

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Editors and Affiliations

  1. School of Mathematics and Physics, University of Science and Technology Beijing, Beijing, China

    Rongming Wang

  2. National Center for Nanoscience Technology, Beijing, China

    Chen Wang

  3. CRANN and AMBER, Trinity College Dublin, University of Dublin, Dublin, Ireland

    Hongzhou Zhang

  4. Department of Condensed Matter Physics and Materials Science, Brookhaven National Laboratory, New York, WA, USA

    Jing Tao

  5. Institute of Physics, Chinese Academy of Sciences, Beijing, China

    Xuedong Bai

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Ge, B. (2018). Scanning Transmission Electron Microscopy (STEM). In: Wang, R., Wang, C., Zhang, H., Tao, J., Bai, X. (eds) Progress in Nanoscale Characterization and Manipulation. Springer Tracts in Modern Physics, vol 272. Springer, Singapore. https://doi.org/10.1007/978-981-13-0454-5_4

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