Abstract
The scanning electron microscope (SEM) is the most widely used tool for characterizing and analyzing the surface of solid samples. It is utilized in many research areas as well as in various industry sectors. Using the SEM, material scientists can study nanoscale features of their samples, which enables them to gain knowledge of the formation and properties of the sample. The SEM is also an indispensable tool to investigate biological samples and it facilitates the observation of bacteria, fungi and viruses.
This is a preview of subscription content, log in via an institution to check access.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
References
Ardenne, M.V.: Das elektronen-rastermikroskop (in German). Zeitschrift für Phys. 109(9–10), 553–572 (1938)
Andrasko, J., Maehly, A.C.: Detection of gunshot residues on hands by scanning electron microscopy. J. Forensic Sci. 279–287 (1977)
Amelinckx, S., van Dyck, D., van Landuyt, J., van Tendeloo, G.: Handbook of Microscopy, pp. 539–561. VCH Verlagsges (1997)
ASTM Standard guide for gunshot residue analysis by scanning electron microscopy/energy dispersive X-ray Spectrometry, Designation: E1588–07 (2007)
Everhart, T.E., Thornley, R.F.M.: Wide-band detector for micro-micro-ampere low-energy electron currents. Adv. Imag. Elect. Phys. 133, 147–152 (1960)
FEI announces new verios extreme high resolution SEM (2012). Nanotechnology Now
Goldstein, J., Newbury, D. E., Echlin, P., Joy, D. C., Romig, Jr. A. D., Lyman, C. E., Fiori, C., Lifshin, E.: Scanning Electron Microscopy and X-Ray Microanalysis, 2nd edn. Plenum Press (1992a)
Goldstein, J., Newbury, D.E., Echlin, P., Joy, D.C., Romig Jr., A.D., Lyman, C.E., Fiori, C., Lifshin, E.: Scanning Electron Microscopy and X-ray Microanalysis, Chapter 2. Springer, New York (1992b)
Hitachi Launches World’s Highest Resolution FE-SEM (2011). Nanotechnology Now
Hough, P.V.C.: Methods and means for recognizing complex patterns. US patent 3069654 (1962)
Joy, D.C.: Monte Carlo Modeling For Electron Microscopy and Microanalysis. Oxford University Press (1995)
Ketek, GmbH. http://dwww.ketek.net/products/sdd-technology/working-principle/ (2013)
Knott, G., Marchman, H., Wall, D., Lich, B.: Serial section scanning electron microscopy of adult brain tissue using focused ion beam milling. J. Neurosci. 28(12), 2959–2964 (2008)
Li, H., Li, Y.M., Lei, Z.C., Wang, K.Y., Guo, A.K.: Transformation of odor selectivity from projection neurons to single mushroom body neurons mapped with dual-color calcium imaging. P. Natl. Acad. Sci. USA 110(29), 12084–12089 (2013)
Oxford Instruments Silicon Drift Detectors Explained (2012)
Oxford Instruments Technique brief, Energy dispersive X-ray microanalysis hardware (2002)
Oxford Instruments Technique brief, Wavelength dispersive X-ray microanalysis (2004)
Parallax Research Inc. http://www.parallaxray.com/wds.html (2013)
Schwartz, A.J., Kumar, M., Adams, B.L., Field, D.P.: Electron Backscatter Diffraction in Materials Science, 2nd edn. Springer, New York (2009)
Smith, K.C.A., Johari, O. (eds.) Proceedings of the 5th Annual SEM Symposium, IITRI, Chicago (1972)
Zhou, W.L., Wang, Z.L.: Scanning Microscopy for Nanotechnology. Springer, New York (2007)
Author information
Authors and Affiliations
Corresponding author
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 2018 Peking University Press and Springer Nature Singapore Pte Ltd.
About this chapter
Cite this chapter
Han, W., Jiao, H., Fox, D. (2018). Scanning Electron Microscopy. In: Wang, R., Wang, C., Zhang, H., Tao, J., Bai, X. (eds) Progress in Nanoscale Characterization and Manipulation. Springer Tracts in Modern Physics, vol 272. Springer, Singapore. https://doi.org/10.1007/978-981-13-0454-5_2
Download citation
DOI: https://doi.org/10.1007/978-981-13-0454-5_2
Published:
Publisher Name: Springer, Singapore
Print ISBN: 978-981-13-0453-8
Online ISBN: 978-981-13-0454-5
eBook Packages: Physics and AstronomyPhysics and Astronomy (R0)