Abstract
The experimetal works in this thesis owing to an ultrahigh vacuum system, in which surface conductivity is measured in situ by four-point-probe method down to 0.8 K, combined with surface preparation/analysis capability by reflection-high-energy-electron-diffraction. This chapter begins with the principle of electron diffraction and four-point-probing, including dual configuration method for the reduction of data scattering, and followed by actual setup, including the cooling procedure of the cryostat.
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References
S. Yamazaki, Y. Hosomura, I. Matsuda, R. Hobara, T. Eguchi, Y. Hasegawa, S. Hasegawa, Phys. Rev. Lett. 106, 116802 (2011)
S. Yoshimoto, Y. Murata, K. Kubo, K. Tomita, K. Motoyoshi, T. Kimura, H. Okino, R. Hobara, I. Matsuda, S.I. Honda, et al. Nano Lett. 7, 956 (2007)
R.A. Smith, Semiconductors (Cambridge Univ, Press, 1978)
S.M. Sze, K.K. Ng, Physics of Semiconductor Devices (Wiley, New York, 2006)
S. Hatta, T. Noma, H. Okuyama, T. Aruga, Phys. Rev. B 90, 245407 (2014)
F. Smits, Bell Syst. Tech. J. 37, 711 (1958)
L. Van der Pauw, Philip. Tech. Rev. 20, 220 (1958)
R. Rymaszewski, J. Phys. E Sci. Instrum. 2, 170 (1969)
D.H. Petersen, R. Lin, T.M. Hansen, E. Rosseel, W. Vandervorst, C. Markvardsen, D. Kjær, P.F. Nielsen, J. Vac. Sci. Technol. B 26, 362 (2008)
D.H. Petersen, O. Hansen, T.M. Hansen, P. Bøggild, R. Lin, D. Kjær, P.F. Nielsen, T. Clarysse, W. Vandervorst, E. Rosseel, et al., J. Vac. Sci. Technol. B Nanotechnol. Microelectron. Mater. Process. Meas. Phenom. 28(1), C1C27 (2010)
D.H. Petersen, O. Hansen, R. Lin, P.F. Nielsen, J. Appl. Phys. 104, 013710 (2008)
T. Tanikawa, I. Matsuda, R. Hobara, S. Hasegawa, E-J. Surf. Sci. Nanotechnol. 1, 50 (2003)
T. Uchihashi, P. Mishra, M. Aono, T. Nakayama, Phys. Rev. Lett. 107, 207001 (2011)
M. Ono, T. Nishio, T. Eguchi, Y. Hasegawa, E-J. Surf. Sci. Nanotechnol. 2, 165 (2004)
M. Yamada, T. Hirahara, R. Hobara, S. Hasegawa, H. Mizuno, Y. Miyatake, T. Nagamura, E-J. Surf. Sci. Nanotechnol. 10, 400 (2012)
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Ichinokura, S. (2018). Experimental Methods. In: Observation of Superconductivity in Epitaxially Grown Atomic Layers. Springer Theses. Springer, Singapore. https://doi.org/10.1007/978-981-10-6853-9_3
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DOI: https://doi.org/10.1007/978-981-10-6853-9_3
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