Skip to main content

Results and Discussion on Ionization and Breakdown of Graphene Field-Effect Transistor

  • Chapter
  • First Online:
Analytical Modelling of Breakdown Effect in Graphene Nanoribbon Field Effect Transistor

Part of the book series: SpringerBriefs in Applied Sciences and Technology ((BRIEFSAPPLSCIENCES))

  • 442 Accesses

Abstract

Based on the proposed semi-analytical models in the previous chapter, lateral electric field and length of velocity saturation region are plotted with respect to structural parameters in this chapter. In addition, ionization coefficient is calculated with respect to inverse electric field. Finally, the breakdown voltage is calculated for DG- and SG-GNRFETs and the trends and profiles are discussed. TableĀ 4.1 shows default values for all the parameters which can be used for repeating the experiments.

This is a preview of subscription content, log in via an institution to check access.

Access this chapter

Chapter
USD 29.95
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
eBook
USD 39.99
Price excludes VAT (USA)
  • Available as EPUB and PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book
USD 54.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Purchases are for personal use only

Institutional subscriptions

References

  1. W. Yang, X. Cheng, Y. Yu, Z. Song, D. Shen, A novel analytical model for the breakdown voltage of thin-film SOI power MOSFETs. Solid-State Electron. 49(1), 43ā€“48 (2005)

    ArticleĀ  Google ScholarĀ 

  2. K. Yeom, J. Hinckley, J. Singh, Calculation of electron and hole impact ionization coefficients in SiGe alloys. J. Appl. Phys. 80(12), 6773ā€“6782 (1996)

    ArticleĀ  Google ScholarĀ 

  3. M. Ghadiry, M. Nadi, M. Saiedmanesh, H. Abadi, An analytical approach to study breakdown mechanism in graphene nanoribbon field effect transistors. J. Comput. Theor. Nanosci. 11(2), 339ā€“343 (2014)

    ArticleĀ  Google ScholarĀ 

  4. M. Ghadiry, A.A. Manaf, M.T. Ahmadi, H. Sadeghi, M.N. Senejani, Design and analysis of a new carbon nanotube full adder cell. J. Nanomater. 2011, 36 (2011)

    ArticleĀ  Google ScholarĀ 

  5. M. Frisch, G. Trucks, H.B. Schlegel, G. Scuseria, M. Robb, J. Cheeseman, G. Scalmani, V. Barone, B. Mennucci, G. Petersson, Gaussian 09, Revision A. 02. Gaussian, Inc., Wallingford, CT, 200 (2009)

    Google ScholarĀ 

  6. V. Su, I. Lin, J. Kuo, G. Lin, D. Chen, C. Yeh, C. Tsai, M. Ma, Breakdown behavior of 40-nm PD-SOI NMOS device considering STI-induced mechanical stress effect. IEEE Electron Device Lett. 29(6), 612ā€“614 (2008)

    ArticleĀ  Google ScholarĀ 

  7. H. Wong, Drain breakdown in submicron MOSFETs: a review. Microelectron. Reliab. 40(1), 3ā€“15 (2000)

    ArticleĀ  Google ScholarĀ 

  8. M.T. Ahmadi, Z. Johari, N.A. Amin, A.H. Fallahpour, R. Ismail, Graphene nanoribbon conductance model in parabolic band structure. J. Nanomater. 2010, 12 (2010)

    ArticleĀ  Google ScholarĀ 

Download references

Author information

Authors and Affiliations

Authors

Corresponding author

Correspondence to Iraj Sadegh Amiri .

Rights and permissions

Reprints and permissions

Copyright information

Ā© 2018 The Author(s)

About this chapter

Check for updates. Verify currency and authenticity via CrossMark

Cite this chapter

Amiri, I.S., Ghadiry, M. (2018). Results and Discussion on Ionization and Breakdown of Graphene Field-Effect Transistor. In: Analytical Modelling of Breakdown Effect in Graphene Nanoribbon Field Effect Transistor. SpringerBriefs in Applied Sciences and Technology. Springer, Singapore. https://doi.org/10.1007/978-981-10-6550-7_4

Download citation

  • DOI: https://doi.org/10.1007/978-981-10-6550-7_4

  • Published:

  • Publisher Name: Springer, Singapore

  • Print ISBN: 978-981-10-6549-1

  • Online ISBN: 978-981-10-6550-7

  • eBook Packages: EngineeringEngineering (R0)

Publish with us

Policies and ethics